Inventor · disambiguated record
Hirohito Okuda
Also filed as: OKUDA HIROHITO
18 granted patents·1 pending application·324 citations·filing 1999–2014
95Inventor score
Top patents by PatentIndex Score
19 records- 0194US7170593B2Method of reviewing detected defectsHITACHI LTD·Filed 2005·Granted Jan 30, 2007·25 cites·9 claims
- 0291US7521676B2Method and apparatus for inspecting pattern defects and mirror electron projection type or multi-beam scanning type electron beam apparatusHITACHI HIGH TECH CORP·Filed 2006·Granted Apr 21, 2009·16 cites·19 claims
- 0391US7231079B2Method and system for inspecting electronic circuit patternHITACHI LTD·Filed 2002·Granted Jun 12, 2007·44 cites·27 claims
- 0487US7734082B2Defect inspection methodHITACHI HIGH TECH CORP·Filed 2008·Granted Jun 8, 2010·14 cites·8 claims
- 0586US7075077B2Method of observing a specimen using a scanning electron microscopeHITACHI HIGH TECH CORP·Filed 2004·Granted Jul 11, 2006·23 cites·7 claims
- 0685US7205555B2Defect inspection apparatus and defect inspection methodHITACHI LTD·Filed 2005·Granted Apr 17, 2007·8 cites·11 claims
- 0781US7420167B2Apparatus and method for electron beam inspection with projection electron microscopyHITACHI HIGH TECH CORP·Filed 2006·Granted Sep 2, 2008·6 cites·18 claims
- 0881US6855930B2Defect inspection apparatus and defect inspection methodHITACHI LTD·Filed 2002·Granted Feb 15, 2005·26 cites·9 claims
- 0980US7424146B2Defect inspection methodHITACHI HIGH TECH CORP·Filed 2003·Granted Sep 9, 2008·24 cites·20 claims
- 1080US7034299B2Transmission electron microscope system and method of inspecting a specimen using the sameHITACHI HIGH TECH CORP·Filed 2004·Granted Apr 25, 2006·15 cites·19 claims
- 1175US6965429B2Method of reviewing detected defectsHITACHI LTD·Filed 2002·Granted Nov 15, 2005·10 cites·18 claims
- 1273US7583832B2Method and its apparatus for classifying defectsHITACHI LTD·Filed 2003·Granted Sep 1, 2009·18 cites·14 claims
- 1373US6622054B1Method monitoring a quality of electronic circuits and its manufacturing condition and system for itHITACHI LTD·Filed 1999·Granted Sep 16, 2003·36 cites·16 claims
- 1472US7602962B2Method of classifying defects using multiple inspection machinesHITACHI HIGH TECH CORP·Filed 2004·Granted Oct 13, 2009·27 cites·4 claims
- 1569US7181060B2Defect inspection methodHITACHI LTD·Filed 2002·Granted Feb 20, 2007·9 cites·13 claims
- 1665US8111902B2Method and apparatus for inspecting defects of circuit patternsHIROI TAKASHI·Filed 2006·Granted Feb 7, 2012·4 cites·12 claims
- 1763US7756320B2Defect classification using a logical equation for high stage classificationHITACHI HIGH TECH CORP·Filed 2004·Granted Jul 13, 2010·10 cites·4 claims
- 1855US7873205B2Apparatus and method for classifying defects using multiple classification modulesHITACHI HIGH TECH CORP·Filed 2004·Granted Jan 18, 2011·9 cites·10 claims
- 1946US2016169996A1Method and system for cardiac scan plane prescriptionGEN ELECTRIC·Filed 2014·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →