Inventor · disambiguated record
Hiromi Oshima
Also filed as: OSHIMA HIROMI
10 granted patents·2 pending applications·101 citations·filing 1996–2013
88Inventor score
Top patents by PatentIndex Score
12 records- 0184US9140752B2Tester hardwareADVANTEST CORP·Filed 2013·Granted Sep 22, 2015·6 cites·16 claims
- 0284US6877118B2Memory testing method and memory testing apparatusADVANTEST CORP·Filed 2001·Granted Apr 5, 2005·42 cites·9 claims
- 0374US8287214B2Tool head, machine tool and boring method of bore of cylinder block using the machine toolSADAOKA HIDEKI·Filed 2007·Granted Oct 16, 2012·8 cites·13 claims
- 0462US8718123B2Test apparatus and test methodYOSHIBA KAZUMICHI·Filed 2012·Granted May 6, 2014·4 cites·3 claims
- 0552US6490700B1Memory device testing apparatus and data selection circuitADVANTEST CORP·Filed 1999·Granted Dec 3, 2002·15 cites·35 claims
- 0648US5914964AMemory fail analysis device in semiconductor memory test systemADVANTEST CORP·Filed 1996·Granted Jun 22, 1999·14 cites·4 claims
- 0746US8981786B2Test apparatus and test methodOSHIMA HIROMI·Filed 2012·Granted Mar 17, 2015·1 cites·6 claims
- 0834US2012304009A1Test apparatus and test methodOSHIMA HIROMI·Filed 2012·Application pending·0 cites
- 0934US2012331346A1Test apparatus and test methodOSHIMA HIROMI·Filed 2012·Application pending·0 cites
- 1033US8898531B2Test apparatus and test methodOSHIMA HIROMI·Filed 2012·Granted Nov 25, 2014·0 cites·20 claims
- 1133US5757815ASemiconductor memory test systemADVANTEST CORP·Filed 1996·Granted May 26, 1998·7 cites·6 claims
- 1231US6158037AMemory testerADVANTEST CORP·Filed 1997·Granted Dec 5, 2000·4 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →