Inventor · disambiguated record
Hisayuki Saito
Also filed as: SAITO HISAYUKI
6 granted patents·8 citations·filing 2006–2017
73Inventor score
Top patents by PatentIndex Score
6 records- 0173US10983158B2Method for evaluating crystal defectsSHINETSU HANDOTAI KK·Filed 2017·Granted Apr 20, 2021·2 cites·4 claims
- 0270US10345102B2Method for evaluating warpage of wafer and method for sorting waferSHINETSU HANDOTAI KK·Filed 2015·Granted Jul 9, 2019·2 cites·16 claims
- 0363US9337013B2Silicon wafer and method for producing the sameFUSEGAWA IZUMI·Filed 2012·Granted May 10, 2016·2 cites·2 claims
- 0463US7718446B2Evaluation method for crystal defect in silicon single crystal waferSHINETSU HANDOTAI KK·Filed 2006·Granted May 18, 2010·2 cites·12 claims
- 0541US10234281B2Method for evaluating hazeSHINETSU HANDOTAI KK·Filed 2016·Granted Mar 19, 2019·0 cites·2 claims
- 0637US8111081B2Method for evaluating silicon waferSAITO HISAYUKI·Filed 2007·Granted Feb 7, 2012·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →