Inventor · disambiguated record
Hitoshi Shimizu
Also filed as: SHIMIZU HITOSHI
156 granted patents·37 pending applications·1,533 citations·filing 1971–2025
99Inventor score
Files withFUJIFILM CORP42FUJI PHOTO FILM CO LTD26FURUKAWA ELECTRIC CO LTD24TOPCON CORP14ASAHI OPTICAL CO LTD13
Top patents by PatentIndex Score
193 records- 0198US9079027B2Radiation irradiation device, radiation irradiation method and program storage mediumFUJIFILM CORP·Filed 2014·Granted Jul 14, 2015·25 cites·21 claims
- 0296US7457550B2Abnormality determining apparatus, image forming apparatus, copying machine, and information obtaining methodRICOH KK·Filed 2006·Granted Nov 25, 2008·32 cites·9 claims
- 0394US11520224B2Projection lens and projection deviceFUJIFILM CORP·Filed 2021·Granted Dec 6, 2022·3 cites·20 claims
- 0491US7962054B2Image forming apparatus having a function of predicting device deterioration based on a plurality of types of operation control informationRICOH CO LTD·Filed 2007·Granted Jun 14, 2011·11 cites·12 claims
- 0591US7778555B2Abnormality determining apparatus, image forming apparatus, copying machine, and information obtaining methodRICOH KK·Filed 2008·Granted Aug 17, 2010·14 cites·22 claims
- 0690US11320729B2Projection apparatusFUJIFILM CORP·Filed 2021·Granted May 3, 2022·2 cites·20 claims
- 0790US7030988B2Measuring apparatus and measuring chipFUJI PHOTO FILM CO LTD·Filed 2002·Granted Apr 18, 2006·38 cites·18 claims
- 0889US11871160B2Projection apparatusFUJIFILM CORP·Filed 2021·Granted Jan 9, 2024·2 cites·20 claims
- 0989US5671449ASwitching system for cameraASAHI OPTICAL CO LTD·Filed 1996·Granted Sep 23, 1997·33 cites·52 claims
- 1089US3998867AProcess for the simultaneous preparation of methacrylonitrile and 1,3-butadieneNIPPON KAYAKU KK·Filed 1974·Granted Dec 21, 1976·20 cites·6 claims
- 1187US5364481AApparatus for manufacturing a thin-film photovoltaic conversion deviceFUJI ELECTRIC CO LTD·Filed 1993·Granted Nov 15, 1994·69 cites·19 claims
- 1285US8488644B2Semiconductor laser element and manufacturing method thereofIMAI SUGURU·Filed 2009·Granted Jul 16, 2013·16 cites·19 claims
- 1385US7545501B2Sensor unit for assay and prismFUJIFILM CORP·Filed 2007·Granted Jun 9, 2009·9 cites·12 claims
- 1485US7075654B2Measuring apparatus and measuring chipFUJI PHOTO FILM CO LTD·Filed 2005·Granted Jul 11, 2006·8 cites·9 claims
- 1585US6588908B2Projector deviceFUJI PHOTO OPTICAL CO LTD·Filed 2002·Granted Jul 8, 2003·28 cites·2 claims
- 1685US5583878ASemiconductor optical deviceFURUKAWA ELECTRIC CO LTD·Filed 1994·Granted Dec 10, 1996·48 cites·12 claims
- 1784US6601959B2Projector device wherein the incidence angle of the illumination light is made variable depending on whether the projector device is in a used or unused stateFUJI PHOTO OPTICAL CO LTD·Filed 2002·Granted Aug 5, 2003·27 cites·6 claims
- 1883US9904153B2Projection device, projector, and image adjustment methodFUJIFILM CORP·Filed 2017·Granted Feb 27, 2018·3 cites·20 claims
- 1983US5171941ASuperconducting strand for alternating currentFURUKAWA ELECTRIC CO LTD·Filed 1991·Granted Dec 15, 1992·45 cites·11 claims
- 2082US8327804B2Measurement object holder, living body holder, and optical measurement instrumentYAMADA YUKIO·Filed 2010·Granted Dec 11, 2012·4 cites·10 claims
- 2182US5217822ASolid oxide electrolyte type fuel cell and method for fabricating the sameFUJI ELECTRIC CO LTD·Filed 1991·Granted Jun 8, 1993·46 cites·17 claims
- 2282US2025325180A1Slit lamp microscope, ophthalmic system, method of controlling slit lamp microscope, and recording mediumTOPCON CORP·Filed 2025·Application pending·0 cites
- 2381US4569115AMethod and apparatus for controlling the depth of cut in the radial direction of a rotary cutting tool in a machine toolIKEGAI IRON WORKS LTD·Filed 1983·Granted Feb 11, 1986·35 cites·3 claims
- 2481US3966823AProcess for preparing 1,3-butadiene and methacrolein simultaneouslyNIPPON KAYAKU KK·Filed 1971·Granted Jun 29, 1976·29 cites·5 claims
- 2580US10448826B2Visual function testing device and visual function testing systemKK TOPCON·Filed 2015·Granted Oct 22, 2019·4 cites·20 claims
- 2680US7625748B2Flow cell device, sensor unit and assay apparatusFUJIFILM CORP·Filed 2006·Granted Dec 1, 2009·7 cites·18 claims
- 2780US6791691B2Measuring method and apparatus using attenuation in total internal reflectionFUJI PHOTO FILM CO LTD·Filed 2002·Granted Sep 14, 2004·16 cites·17 claims
- 2879US6693269B2Image reader with DC-coupled integration circuitFUJI PHOTO FILM CO LTD·Filed 2001·Granted Feb 17, 2004·22 cites·19 claims
- 2979US4000088AOxidation catalyst for the manufacture of methacrylic acidNIPPON KAYAKU KK·Filed 1974·Granted Dec 28, 1976·26 cites·3 claims
- 3079US2025268470A1Slit lamp microscope, ophthalmic system, method of controlling slit lamp microscope, and recording mediumTOPCON CORP·Filed 2025·Application pending·0 cites
- 3178US7074777B2Vitamin D derivativesCHUGAI PHARMACEUTICAL CO LTD·Filed 2001·Granted Jul 11, 2006·12 cites·11 claims
- 3277US7575718B2Fluid feeding system, fluid feeding method and flow channel unitFUJIFILM CORP·Filed 2006·Granted Aug 18, 2009·5 cites·15 claims
- 3377US7187444B2Measuring method and apparatus using attenuation in total internal reflectionFUJI PHOTO FILM CO LTD·Filed 2002·Granted Mar 6, 2007·14 cites·80 claims
- 3477US5572043ASchottky junction device having a Schottky junction of a semiconductor and a metalFURUKAWA ELECTRIC CO LTD·Filed 1995·Granted Nov 5, 1996·39 cites·7 claims
- 3577US5318908AMethod for cultivation of nitrile hydratase-producing pseudomonasNITTO CHEMICAL INDUSTRY CO LTD·Filed 1991·Granted Jun 7, 1994·26 cites·5 claims
- 3677US2025255483A1Ophthalmic apparatus and method of controlling sameTOPCON CORP·Filed 2025·Application pending·0 cites
- 3776US7322702B2Projecting display apparatusFUJINON CORP·Filed 2005·Granted Jan 29, 2008·5 cites·9 claims
- 3876US6885454B2Measuring apparatusFUJI PHOTO FILM CO LTD·Filed 2002·Granted Apr 26, 2005·14 cites·27 claims
- 3976US5765060APhotometry device for a cameraASAHI OPTICAL CO LTD·Filed 1995·Granted Jun 9, 1998·14 cites·36 claims
- 4075US7301642B2Apparatus and method of assay in utilizing attenuated total reflectionFUJIFILM CORP·Filed 2005·Granted Nov 27, 2007·4 cites·18 claims
- 4175US6472691B2Distributed feedback semiconductor laser deviceFURUKAWA ELECTRIC CO LTD·Filed 2001·Granted Oct 29, 2002·12 cites·7 claims
- 4275US4012449AProduction of methacrolein and oxidation catalyst used thereforNIPPON KAYAKU KK·Filed 1975·Granted Mar 15, 1977·26 cites·7 claims
- 4374US7102754B2Measuring method and apparatus using attenuation in total internal reflectionFUJI PHOTO FILM CO LTD·Filed 2004·Granted Sep 5, 2006·10 cites·12 claims
- 4473US7715012B2Sensor unit and assay method of assay in utilizing attenuated total reflectionFUJIFILM CORP·Filed 2009·Granted May 11, 2010·3 cites·2 claims
- 4573US7515270B2Sensor unit and assay method of assay in utilizing attenuated total reflectionFUJIFILM CORP·Filed 2006·Granted Apr 7, 2009·3 cites·14 claims
- 4673US7397536B2Projection image display apparatusFUJINON CORP·Filed 2005·Granted Jul 8, 2008·6 cites·9 claims
- 4773US5592250ADriving mechanism for a photograhing optical systemASAHI OPTICAL CO LTD·Filed 1995·Granted Jan 7, 1997·39 cites·31 claims
- 4873US5049911ADevice for indicating a remaining quantity of recordable parts of a recording material in a cameraASAHI OPTICAL CO LTD·Filed 1989·Granted Sep 17, 1991·12 cites·11 claims
- 4972US9300114B2Laser device, method of manufacturing the same, laser device array, light source and light moduleSHIMIZU HITOSHI·Filed 2012·Granted Mar 29, 2016·3 cites·20 claims
- 5072US6396861B1N-type modulation-doped multi quantum well semiconductor laser deviceFURUKAWA ELECTRIC CO LTD·Filed 1999·Granted May 28, 2002·34 cites·12 claims
Showing the top 50 of 193 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →