Inventor · disambiguated record
Hiroyuki Shiotsuka
Also filed as: SHIOTSUKA HIROYUKI
5 granted patents·68 citations·filing 1996–2001
78Inventor score
Files withADVANTEST CORP5
Top patents by PatentIndex Score
5 records- 0173US6417682B1Semiconductor device testing apparatus and its calibration methodADVANTEST CORP·Filed 1999·Granted Jul 9, 2002·46 cites·42 claims
- 0243US5945822AProgrammable load circuitADVANTEST CORP·Filed 1997·Granted Aug 31, 1999·13 cites·7 claims
- 0336US6242966B1Leakage current correcting circuitADVANTEST CORP·Filed 1997·Granted Jun 5, 2001·6 cites·5 claims
- 0435US6400193B1High speed, high current and low power consumption output circuitADVANTEST CORP·Filed 2001·Granted Jun 4, 2002·1 cites·9 claims
- 0528US5781059ADriver circuit for semiconductor test systemADVANTEST CORP·Filed 1996·Granted Jul 14, 1998·2 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →