Inventor · disambiguated record
Hiroyuki Takamatsu
Also filed as: TAKAMATSU HIROYUKI
33 granted patents·8 pending applications·587 citations·filing 1987–2023
97Inventor score
Top patents by PatentIndex Score
41 records- 0193US5822099ALight communication systemSONY CORP·Filed 1996·Granted Oct 13, 1998·183 cites·14 claims
- 0288US4874939AMethod and apparatus for detecting position/variance of input light using linear and quadratic outputsKOBE STEEL LTD·Filed 1987·Granted Oct 17, 1989·83 cites·9 claims
- 0381US12241803B2Method for measuring residual stressKOBE STEEL LTD·Filed 2021·Granted Mar 4, 2025·1 cites·5 claims
- 0481US11761752B2Device and method for measuring oxide film thicknessKOBE STEEL LTD·Filed 2019·Granted Sep 19, 2023·1 cites·2 claims
- 0580US10914692B2Method for measuring stressKOBE STEEL LTD·Filed 2018·Granted Feb 9, 2021·2 cites·8 claims
- 0678US9160219B2Axial gap type brushless motorTAKAMATSU HIROYUKI·Filed 2010·Granted Oct 13, 2015·6 cites·15 claims
- 0774US11221304B2Method for measuring stressKOBE STEEL LTD·Filed 2018·Granted Jan 11, 2022·1 cites·10 claims
- 0874US5619326AMethod of sample valuation based on the measurement of photothermal displacementKOBE STEEL LTD·Filed 1995·Granted Apr 8, 1997·43 cites·9 claims
- 0973US7522287B2Photothermal conversion measurement apparatus, photothermal conversion measurement method, and sample cellKOBE STEEL LTD·Filed 2006·Granted Apr 21, 2009·4 cites·19 claims
- 1073US5298970ASample evaluating method by using thermal expansion displacementKOBE STEEL LTD·Filed 1992·Granted Mar 29, 1994·40 cites·6 claims
- 1171US7897025B2Method and apparatus for forming thin filmKOBE STEEL LTD·Filed 2004·Granted Mar 1, 2011·11 cites·18 claims
- 1270US8023118B2Analyzer for absorption spectrometry of impurity concentration contained in liquid using exciting lightKOBE STEEL LTD·Filed 2007·Granted Sep 20, 2011·3 cites·8 claims
- 1369US8836452B2Tuner module and receiving deviceIMAI TADASHI·Filed 2011·Granted Sep 16, 2014·2 cites·12 claims
- 1467US7028887B2Dispatch operation plan devising system and computer readable record medium storing a dispatch operation plan devising programFUJITSU LTD·Filed 2003·Granted Apr 18, 2006·9 cites·20 claims
- 1567US2025354095A1Alcoholic beverage to be imbibed at low temperature, and method for manufacturing sameLOTTE CO LTD·Filed 2023·Application pending·0 cites
- 1666US8660318B2Living body information registration method, biometrics authentication method, and biometrics authentication apparatusKOMURA KAZUHIRO·Filed 2012·Granted Feb 25, 2014·6 cites·11 claims
- 1762US5626681AMethod of cleaning semiconductor wafersSHINETSU HANDOTAI KK·Filed 1995·Granted May 6, 1997·26 cites·4 claims
- 1861US5665168AMethod for cleaning semiconductor silicon waferSHINETSU HANDOTAI KK·Filed 1995·Granted Sep 9, 1997·26 cites·5 claims
- 1959US8270680B2Body part guidance control method for non-contact biometrics authentication device and non-contact biometrics authentication deviceMANABE MICHITARO·Filed 2008·Granted Sep 18, 2012·7 cites·16 claims
- 2055US8367329B2Method of detecting interaction between nucleic acid and protein, and apparatus for the sameUNIV TOKYO NAT UNIV CORP·Filed 2007·Granted Feb 5, 2013·0 cites·9 claims
- 2155US5591966APhotosensor package with defined locations for lens supporting leadSONY CORP·Filed 1995·Granted Jan 7, 1997·22 cites·20 claims
- 2253US10532112B2Non-human primate model of age-related macular degeneration and method for producing sameHAMAMATSU PHARMA RES INC·Filed 2017·Granted Jan 14, 2020·0 cites·7 claims
- 2353US8952338B2Crystalline quality evaluation apparatus for thin-film semiconductors, using μ-PCD techniqueSAKODA NAOKAZU·Filed 2011·Granted Feb 10, 2015·1 cites·6 claims
- 2449US6067028AIdentification signal registering method and identification signal registering apparatusSONY CORP·Filed 1997·Granted May 23, 2000·42 cites·6 claims
- 2549US5760597AMethod of and apparatus for measuring lifetime of carriers in semiconductor sampleKOBE STEEL LTD·Filed 1996·Granted Jun 2, 1998·17 cites·14 claims
- 2647US6319845B1Method of purifying alkaline solution and method of etching semiconductor wafersSHINETSU HANDOTAI KK·Filed 1998·Granted Nov 20, 2001·8 cites·8 claims
- 2747US5640238AMethod of inspecting particles on wafersSHINETSU HANDOTAI KK·Filed 1996·Granted Jun 17, 1997·14 cites·8 claims
- 2846US2008123099A1Photothermal conversion measuring instrumentKOBE STEEL LTD·Filed 2007·Application pending·0 cites
- 2944US11852458B2Oxide film thickness measurement device and methodKOBE STEEL LTD·Filed 2019·Granted Dec 26, 2023·0 cites·2 claims
- 3043US5623143APhoto sensor having sectioned lensSONY CORP·Filed 1995·Granted Apr 22, 1997·12 cites·13 claims
- 3142US2007285391A1Peripheral deviceYOKOGI KIYOTADA·Filed 2007·Application pending·0 cites
- 3242US2021055173A1Method for measuring residual stressKOBE STEEL LTD·Filed 2018·Application pending·0 cites
- 3341US2014168519A1Tuner module and receiving apparatusIMAI TADASHI·Filed 2012·Application pending·0 cites
- 3440US2013119758A1Mount structure to mount power controller on vehicle bodyHONDA MOTOR CO LTD·Filed 2012·Application pending·0 cites
- 3539US5662743AMethod of cleaning silicon wafers in cleaning baths with controlled vertical surface oscillations and controlled in/out speedsSHINETSU HANDOTAI KK·Filed 1995·Granted Sep 2, 1997·8 cites·9 claims
- 3639US2004158539A1Operation plan devising system, operation plan devising apparatus and computer readable record medium storing an operation plan devising programFUJITSU LTD·Filed 2003·Application pending·0 cites
- 3738US2020340933A1Method for measuring residual stressKOBE STEEL LTD·Filed 2018·Application pending·0 cites
- 3835USD367848SModule for receiving infra-red signal of remote controllerSONY CORP·Filed 1994·Granted Mar 12, 1996·2 cites·1 claims
- 3932US5963141AApparatus for checking identification signal and method thereofSONY CORP·Filed 1997·Granted Oct 5, 1999·7 cites·14 claims
- 4029US9279762B2Apparatus and method for measuring semiconductor carrier lifetimeHAYASHI KAZUSHI·Filed 2010·Granted Mar 8, 2016·0 cites·10 claims
- 4120US6251670B1Method of culturing cells in suspension using lectinsPRESIDENT OF KANAZAWA UNIVERSI·Filed 1999·Granted Jun 26, 2001·0 cites·8 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →