Inventor · disambiguated record
Hisayuki Takasu
Also filed as: TAKASU HISAYUKI
30 granted patents·13 pending applications·16 citations·filing 2003–2025
93Inventor score
Files withHITACHI HIGH TECH CORP37HITACHI SCIENCE SYSTEMS LTD2IWAYA TORU1NAKAJIMA RIE1TAKEUCHI SHUICHI1
Top patents by PatentIndex Score
43 records- 0184US10304653B2Ion milling device, ion source and ion milling methodHITACHI HIGH TECH CORP·Filed 2015·Granted May 28, 2019·3 cites·20 claims
- 0281US11621141B2Ion milling device and ion milling methodHITACHI HIGH TECH CORP·Filed 2016·Granted Apr 4, 2023·2 cites·6 claims
- 0381US11226273B2Sample holder, ion milling apparatus, sample processing method, sample observing method, and sample processing and observing methodHITACHI HIGH TECH CORP·Filed 2016·Granted Jan 18, 2022·3 cites·11 claims
- 0469US11508552B2Ion milling deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Nov 22, 2022·1 cites·11 claims
- 0568US10361065B2Ion milling systemHITACHI HIGH TECH CORP·Filed 2015·Granted Jul 23, 2019·1 cites·14 claims
- 0668US2025149289A1Ion milling deviceHITACHI HIGH TECH CORP·Filed 2025·Application pending·0 cites
- 0763US11158481B2Ion milling device, ion source, and ion milling methodHITACHI HIGH TECH CORP·Filed 2019·Granted Oct 26, 2021·0 cites·17 claims
- 0859US12224155B2Ion milling deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Feb 11, 2025·0 cites·13 claims
- 0959US11133153B2Ion milling deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Sep 28, 2021·0 cites·17 claims
- 1057US7033089B2Method of developing a resist film and a resist development processorHITACHI SCIENCE SYSTEMS LTD·Filed 2003·Granted Apr 25, 2006·6 cites·4 claims
- 1156US2025308834A1Ion milling device and ion milling methodHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 1254US12051560B2Ion gun and ion milling machineHITACHI HIGH TECH CORP·Filed 2019·Granted Jul 30, 2024·0 cites·19 claims
- 1354US10008365B2Ion milling deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Jun 26, 2018·0 cites·16 claims
- 1451US12020893B2Ion milling deviceHITACHI HIGH TECH CORP·Filed 2020·Granted Jun 25, 2024·0 cites·14 claims
- 1551US11004652B2Ion milling deviceHITACHI HIGH TECH CORP·Filed 2017·Granted May 11, 2021·0 cites·9 claims
- 1651US9761412B2Ion milling apparatus and sample processing methodHITACHI HIGH TECH CORP·Filed 2014·Granted Sep 12, 2017·0 cites·14 claims
- 1751US2025003841A1Ion Milling DeviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 1851US2025149288A1Ion Milling Device, and Inspection SystemHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 1950US12080511B2Sample holder, method for using sample holder, projection amount adjustment jig, projection amount adjustment method and charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Sep 3, 2024·0 cites·14 claims
- 2050US2024120174A1Ion Milling DeviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 2149US11894213B2Ion milling deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Feb 6, 2024·0 cites·14 claims
- 2249US10192710B2Ion milling apparatus and ion milling methodHITACHI HIGH TECH CORP·Filed 2015·Granted Jan 29, 2019·0 cites·21 claims
- 2349US2025149287A1Ion Milling DeviceHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 2449US2025285832A1Ion Milling Device, Holder, and Cross-Section Milling Treatment MethodHITACHI HIGH TECH CORP·Filed 2022·Application pending·0 cites
- 2548US12230471B2Ion milling deviceHITACHI HIGH TECH CORP·Filed 2019·Granted Feb 18, 2025·0 cites·10 claims
- 2648US10515777B2Ion milling device and processing method using the ion milling deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Dec 24, 2019·0 cites·13 claims
- 2748US9558912B2Ion milling deviceHITACHI HIGH TECH CORP·Filed 2014·Granted Jan 31, 2017·0 cites·13 claims
- 2847US9499900B2Ion milling deviceHITACHI HIGH TECH CORP·Filed 2013·Granted Nov 22, 2016·0 cites·8 claims
- 2947US2024194443A1Ion milling deviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 3046US7179000B2Method of developing a resist film and a resist development processorHITACHI SCIENCE SYSTEMS LTD·Filed 2006·Granted Feb 20, 2007·0 cites·3 claims
- 3145US9343265B2Charged particle beam irradiation apparatusHITACHI HIGH TECH CORP·Filed 2012·Granted May 17, 2016·0 cites·17 claims
- 3245US2013220806A1Ion milling deviceIWAYA TORU·Filed 2011·Application pending·0 cites
- 3345US2025046567A1Ion Milling DeviceHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 3444US11257654B2Ion milling apparatusHITACHI HIGH TECH CORP·Filed 2016·Granted Feb 22, 2022·0 cites·11 claims
- 3544US11244802B2Ion milling device and ion source adjusting method for ion milling deviceHITACHI HIGH TECH CORP·Filed 2018·Granted Feb 8, 2022·0 cites·15 claims
- 3643US11742178B2Ion milling device and milling processing method using sameHITACHI HIGH TECH CORP·Filed 2019·Granted Aug 29, 2023·0 cites·16 claims
- 3742US2024258062A1Ion Milling ApparatusHITACHI HIGH TECH CORP·Filed 2021·Application pending·0 cites
- 3841US10332722B2Ion milling device and ion milling methodHITACHI HIGH TECH CORP·Filed 2015·Granted Jun 25, 2019·0 cites·10 claims
- 3941US2014124367A1Sample preparation apparatus, sample preparation method, and charged particle beam apparatus using the sameTAKEUCHI SHUICHI·Filed 2012·Application pending·0 cites
- 4040US10269534B2Mask position adjustment method of ion milling, electron microscope capable of adjusting mask position, mask adjustment device mounted on sample stage and sample mask component of ion milling deviceHITACHI HIGH TECH CORP·Filed 2015·Granted Apr 23, 2019·0 cites·16 claims
- 4138US9355817B2Ion milling device and ion milling processing methodWATANABE SHUNYA·Filed 2011·Granted May 31, 2016·0 cites·6 claims
- 4236US10832889B2Charged particle beam deviceHITACHI HIGH TECH CORP·Filed 2016·Granted Nov 10, 2020·0 cites·11 claims
- 4333US2012298884A1Ion Milling Device, Sample Processing Method, Processing Device, and Sample Drive MechanismNAKAJIMA RIE·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →