Inventor · disambiguated record
Hidenori Takeda
Also filed as: TAKEDA HIDENORI
7 granted patents·4 pending applications·14 citations·filing 2000–2021
77Inventor score
Files withPIONEER CORP3FUJI SPINNING CO LTD2MATSUSHITA ELECTRIC INDUSTRIAL CO LTD2MITSUBISHI HEAVY IND LTD2PANASONIC CORP2
Top patents by PatentIndex Score
11 records- 0181US9685549B2Nitride semiconductor device and method for manufacturing samePANASONIC CORP·Filed 2013·Granted Jun 20, 2017·4 cites·11 claims
- 0268US9733200B2Defect judging device, radiography system, and defect judging methodMITSUBISHI HEAVY IND LTD·Filed 2013·Granted Aug 15, 2017·2 cites·9 claims
- 0367US9293574B2Semiconductor device and method of manufacturing semiconductor devicePANASONIC CORP·Filed 2014·Granted Mar 22, 2016·2 cites·14 claims
- 0453US7220475B2Polishing sheet and polishing work methodFUJI SPINNING CO LTD·Filed 2003·Granted May 22, 2007·6 cites·20 claims
- 0551US2022198103A1Modeling system and modeling apparatus, modeling method, and modeling programMITSUBISHI HEAVY IND LTD·Filed 2021·Application pending·0 cites
- 0642US7285457B2Heterojunction bipolar transistor and manufacturing method thereofMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2006·Granted Oct 23, 2007·0 cites·5 claims
- 0742US7202515B2Heterojunction bipolar transistor and manufacturing method thereofMATSUSHITA ELECTRIC INDUSTRIAL CO LTD·Filed 2005·Granted Apr 10, 2007·0 cites·3 claims
- 0841US2007184757A1Polishing sheet and polishing work methodFUJI SPINNING CO LTD·Filed 2007·Application pending·0 cites
- 0938US2005019003A1Editing apparatus , information reproduction/recording apparatus, editing method, editing program and information recording mediumPIONEER CORP·Filed 2004·Application pending·0 cites
- 1038US2005019011A1Information recording apparatus, information recording method, information recording program and information recording mediumPIONEER CORP·Filed 2004·Application pending·0 cites
- 1132US6958970B1Disk playerPIONEER CORP·Filed 2000·Granted Oct 25, 2005·0 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →