Inventor · disambiguated record
Hideo Toraya
Also filed as: TORAYA HIDEO
12 granted patents·63 citations·filing 2003–2023
87Inventor score
Top patents by PatentIndex Score
12 records- 0191US7801272B2X-ray diffraction apparatus and X-ray diffraction methodRIGAKU DENKI CO LTD·Filed 2008·Granted Sep 21, 2010·24 cites·13 claims
- 0289US11852597B2Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage mediumRIGAKU DENKI CO LTD·Filed 2022·Granted Dec 26, 2023·1 cites·8 claims
- 0388US12031927B2Method and device for analyzing diffraction pattern of mixture, and information storage mediumRIGAKU DENKI CO LTD·Filed 2021·Granted Jul 9, 2024·1 cites·8 claims
- 0488US8340248B2X-ray diffraction method and X-ray diffraction apparatusTORAYA HIDEO·Filed 2010·Granted Dec 25, 2012·16 cites·6 claims
- 0577US11402341B2Quantitative phase analysis device for analyzing non-crystalline phases, quantitative phase analysis method for analyzing Non-Crystalline phases, and non-transitory computer-readable storage medium storing quantitative phase analysis program for analyzing Non-Crystalline PhasesRIGAKU DENKI CO LTD·Filed 2020·Granted Aug 2, 2022·1 cites·5 claims
- 0677US10962489B2Quantitative phase analysis device, quantitative phase analysis method, and quantitative phase analysis programRIGAKU DENKI CO LTD·Filed 2018·Granted Mar 30, 2021·1 cites·17 claims
- 0775US11841334B2Quantitative phase analysis device, quantitative phase analysis method, and non-transitory computer-readable storage medium storing quantitative phase analysis programRIGAKU DENKI CO LTD·Filed 2020·Granted Dec 12, 2023·1 cites·4 claims
- 0874US6873681B2Method of estimating preferred orientation of polycrystalline materialRIGAKU DENKI CO LTD·Filed 2003·Granted Mar 29, 2005·12 cites·9 claims
- 0973US9146203B2X-ray stress measuring apparatusTORAYA HIDEO·Filed 2011·Granted Sep 29, 2015·6 cites·12 claims
- 1069US12405235B2Degree-of-crystallinity measurement apparatus, degree-of-crystallinity measurement method, and information storage mediumRIGAKU DENKI CO LTD·Filed 2023·Granted Sep 2, 2025·0 cites·11 claims
- 1164US12287300B2Device and method for analyzing diffraction pattern of mixture, and information storage mediumRIGAKU DENKI CO LTD·Filed 2023·Granted Apr 29, 2025·0 cites·10 claims
- 1240US9417195B2Method and its apparatus for x-ray diffractionTORAYA HIDEO·Filed 2011·Granted Aug 16, 2016·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →