Inventor · disambiguated record
Hideyuki Yoko
Also filed as: YOKO HIDEYUKI
26 granted patents·4 pending applications·272 citations·filing 2006–2022
96Inventor score
Top patents by PatentIndex Score
30 records- 0197US8400805B2Semiconductor deviceYOKO HIDEYUKI·Filed 2011·Granted Mar 19, 2013·70 cites·10 claims
- 0296US9805828B1Memory apparatus with post package repairMICRON TECHNOLOGY INC·Filed 2017·Granted Oct 31, 2017·20 cites·20 claims
- 0395US8803545B2Semiconductor device semiconductor device testing method, and data processing systemYOKO HIDEYUKI·Filed 2011·Granted Aug 12, 2014·23 cites·20 claims
- 0494US8599641B2Semiconductor memory device, method of adjusting the same and information processing system including the sameYOKO HIDEYUKI·Filed 2010·Granted Dec 3, 2013·20 cites·23 claims
- 0594US7839159B2ZQ calibration circuit and a semiconductor device including a ZQ calibration circuitELPIDA MEMORY INC·Filed 2006·Granted Nov 23, 2010·38 cites·10 claims
- 0690US8274847B2Semiconductor systemYOKO HIDEYUKI·Filed 2010·Granted Sep 25, 2012·9 cites·8 claims
- 0789US8547775B2Semiconductor memory device and information processing system including the sameYOKO HIDEYUKI·Filed 2010·Granted Oct 1, 2013·13 cites·15 claims
- 0889US8198915B2Semiconductor device using normal and auxiliary through silicon viasYOKO HIDEYUKI·Filed 2010·Granted Jun 12, 2012·12 cites·15 claims
- 0987US10217525B2Memory apparatus with post package repairMICRON TECHNOLOGY INC·Filed 2018·Granted Feb 26, 2019·5 cites·21 claims
- 1085US8400807B2Semiconductor systemYOKO HIDEYUKI·Filed 2012·Granted Mar 19, 2013·5 cites·18 claims
- 1185US7595645B2Calibration circuit and semiconductor device incorporating the sameELPIDA MEMORY INC·Filed 2006·Granted Sep 29, 2009·13 cites·24 claims
- 1283US10056157B1Memory apparatus with post package repairMICRON TECHNOLOGY INC·Filed 2017·Granted Aug 21, 2018·4 cites·17 claims
- 1382US8498831B2Semiconductor device, semiconductor device testing method, and data processing systemIDE AKIRA·Filed 2010·Granted Jul 30, 2013·10 cites·45 claims
- 1480US8687449B2Semiconductor device and information processing system including the sameYOKO HIDEYUKI·Filed 2011·Granted Apr 1, 2014·5 cites·4 claims
- 1579US9123399B2Semiconductor device and information processing system having the samePS4 LUXCO SARL·Filed 2014·Granted Sep 1, 2015·4 cites·14 claims
- 1676US8059484B2Semiconductor storage device and high-speed address-latching methodYOKO HIDEYUKI·Filed 2008·Granted Nov 15, 2011·9 cites·19 claims
- 1772US8441135B2Semiconductor deviceYOKO HIDEYUKI·Filed 2012·Granted May 14, 2013·2 cites·18 claims
- 1872US7869973B2Calibration circuitELPIDA MEMORY INC·Filed 2007·Granted Jan 11, 2011·6 cites·7 claims
- 1970US9087571B2Semiconductor memory device, method of adjusting the same and information processing system including the samePS4 LUXCO SARL·Filed 2013·Granted Jul 21, 2015·2 cites·7 claims
- 2066US8542516B2Semiconductor systemYOKO HIDEYUKI·Filed 2012·Granted Sep 24, 2013·1 cites·19 claims
- 2152US2014344612A1Semiconductor device, semiconductor device testing method, and data processing systemPS4 LUXCO SARL·Filed 2014·Application pending·0 cites
- 2251US10553266B2Semiconductor device chip selectionLONGITUDE SEMICONDUCTOR SARL·Filed 2018·Granted Feb 4, 2020·0 cites·12 claims
- 2349US8364434B2Calibration circuitELPIDA MEMORY INC·Filed 2009·Granted Jan 29, 2013·1 cites·12 claims
- 2447US9911480B2Semiconductor device chip selectionPS4 LUXCO SARL·Filed 2015·Granted Mar 6, 2018·0 cites·28 claims
- 2547USRE46141ESemiconductor device and timing control method for the samePS4 LUXCO SARL·Filed 2014·Granted Sep 6, 2016·0 cites·27 claims
- 2647US2011084404A1Semiconductor deviceELPIDA MEMORY INC·Filed 2010·Application pending·0 cites
- 2745US12198748B2Semiconductor memory devices and controller including adjustable strobe delayULTRAMEMORY INC·Filed 2022·Granted Jan 14, 2025·0 cites·7 claims
- 2839US8134405B2Semiconductor device and timing control method for the sameYOKO HIDEYUKI·Filed 2008·Granted Mar 13, 2012·0 cites·10 claims
- 2937US2009097330A1Fuse latch circuit and fuse latch methodELPIDA MEMORY INC·Filed 2008·Application pending·0 cites
- 3032US2010177588A1Calibration circuit and calibration methodELPIDA MEMORY INC·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →