Inventor · disambiguated record
Hideaki Yoshida
Also filed as: YOSHIDA HIDEAKI
7 granted patents·2 pending applications·557 citations·filing 1997–2004
91Inventor score
Technology areasG01R
Files withGENESIS TECHNOLOGY INC7
Top patents by PatentIndex Score
9 records- 0197US6900647B2Contact probe and probe deviceGENESIS TECHNOLOGY INC·Filed 2004·Granted May 31, 2005·121 cites·8 claims
- 0296US7015710B2Contact probe and probe deviceGENESIS TECHNOLOGY INC·Filed 2004·Granted Mar 21, 2006·118 cites·16 claims
- 0396US6903563B2Contact probe and probe deviceGENESIS TECHNOLOGY INC·Filed 2004·Granted Jun 7, 2005·112 cites·8 claims
- 0494US6937042B2Contact probe and probe deviceGENESIS TECHNOLOGY INC·Filed 2004·Granted Aug 30, 2005·63 cites·9 claims
- 0594US6919732B2Contact probe and probe deviceGENESIS TECHNOLOGY INC·Filed 2004·Granted Jul 19, 2005·62 cites·19 claims
- 0694US6917211B2Contact probe and probe deviceGENESIS TECHNOLOGY INC·Filed 2004·Granted Jul 12, 2005·61 cites·6 claims
- 0784US6710608B2Contact probe and probe deviceGENESIS TECHNOLOGY INC·Filed 2002·Granted Mar 23, 2004·20 cites·2 claims
- 0829US2001040451A1Contact probe for testing liquid crystal display and liquid crystal display testing device having thereofFiled 1997·Application pending·0 cites
- 0927US2001019276A1Contact probe and probe deviceFiled 1997·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →