Inventor · disambiguated record
Ho-Yin Chen
Also filed as: CHEN HO-YIN
12 granted patents·1 pending application·30 citations·filing 2007–2023
86Inventor score
Top patents by PatentIndex Score
13 records- 0183US11736121B1Error correction method, error correction circuit and electronic device applying the sameETRON TECH INC·Filed 2022·Granted Aug 22, 2023·2 cites·12 claims
- 0278US8917568B2Method of operating PSRAM and related memory deviceETRON TECHNOLOGY INC·Filed 2013·Granted Dec 23, 2014·7 cites·12 claims
- 0374US7965577B2Word line defect detecting device and method thereofETRON TECHNOLOGY INC·Filed 2009·Granted Jun 21, 2011·11 cites·6 claims
- 0463US12224768B2Error correction method, error correction circuit and electronic device applying the sameETRON TECH INC·Filed 2023·Granted Feb 11, 2025·0 cites·18 claims
- 0562US8717841B2Method of controlling a refresh operation of PSRAM and related deviceCHEN HO-YIN·Filed 2012·Granted May 6, 2014·3 cites·7 claims
- 0658US10037787B2Circuit for outputting information of a memory circuit during a self-refresh mode and related method thereofETRON TECH INC·Filed 2017·Granted Jul 31, 2018·1 cites·15 claims
- 0756US7609579B2Memory module with failed memory cell repair function and method thereofETRON TECHNOLOGY INC·Filed 2007·Granted Oct 27, 2009·4 cites·16 claims
- 0853US8824238B2Memory device with bi-directional tracking of timing constraintsETRON TECHNOLOGY INC·Filed 2013·Granted Sep 2, 2014·1 cites·11 claims
- 0943US9064601B2Method of providing write recovery protection in PSRAM and related deviceCHEN HO-YIN·Filed 2012·Granted Jun 23, 2015·1 cites·4 claims
- 1033US11494260B2Memory with an error correction function and related memory systemETRON TECH INC·Filed 2018·Granted Nov 8, 2022·0 cites·10 claims
- 1132US8823446B2Current mirror with immunity for the variation of threshold voltage and the generation method thereofSHIAH CHUN·Filed 2009·Granted Sep 2, 2014·0 cites·18 claims
- 1232US2010207676A1Signal converting deviceSHIH JENG-TZONG·Filed 2010·Application pending·0 cites
- 1330US8713386B2Device for increasing chip testing efficiency and method thereofLIU SHI-HUEI·Filed 2012·Granted Apr 29, 2014·0 cites·21 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →