Inventor · disambiguated record
Hong Gan
Also filed as: GAN HONG · GAN HONG-SIEK
1 granted patent·1 pending application·0 citations·filing 2007–2019
11Inventor score
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2 records- 0165US11268895B2Dustproof test device and dustproof test methodHUAWEI TECH CO LTD·Filed 2019·Granted Mar 8, 2022·0 cites·19 claims
- 0238US2008261384A1Method of removing photoresist layer and method of fabricating semiconductor device using the sameUNITED MICROELECTRONICS CORP·Filed 2007·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →