Inventor · disambiguated record
Ho-Kyu Kang
Also filed as: KANG HO SUCK · KANG HO-KYU
15 granted patents·6 pending applications·253 citations·filing 1996–2021
93Inventor score
Top patents by PatentIndex Score
21 records- 0187US8847297B2Image sensor having moisture absorption barrier layer, fabricating method thereof, and device comprising the image sensorKIM HONG-KI·Filed 2010·Granted Sep 30, 2014·10 cites·12 claims
- 0287US7112849B2Method of preventing semiconductor layers from bending and semiconductor device formed therebySAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Sep 26, 2006·10 cites·8 claims
- 0387US6482715B2Method of forming shallow trench isolation layer in semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Nov 19, 2002·48 cites·24 claims
- 0485US7586159B2Semiconductor devices having different gate dielectrics and methods for manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Sep 8, 2009·13 cites·16 claims
- 0583US7052967B2Method for fabricating capacitor array preventing crosstalk between adjacent capacitors in semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted May 30, 2006·33 cites·18 claims
- 0680US6930343B2Nonvolatile memory device utilizing a vertical nanotubeSAMSUNG ELECTRONICS CO LTD·Filed 2003·Granted Aug 16, 2005·28 cites·14 claims
- 0772US6881645B2Method of preventing semiconductor layers from bending and semiconductor device formed therebySAMSUNG ELECTRONICS CO LTD·Filed 2001·Granted Apr 19, 2005·13 cites·9 claims
- 0871US5966614ASilicon nitride-free isolation methods for integrated circuitsSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Oct 12, 1999·39 cites·14 claims
- 0970US6563190B1Capacitor array preventing crosstalk between adjacent capacitors in semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted May 13, 2003·15 cites·14 claims
- 1069US6537914B1Integrated circuit device isolation methods using high selectivity chemical-mechanical polishingSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Mar 25, 2003·12 cites·12 claims
- 1163US7294546B2Capacitor for a semiconductor device and method of fabricating sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Nov 13, 2007·2 cites·9 claims
- 1263US5847424ACapacitor of semiconductor memory device and manufacturing method thereofSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Dec 8, 1998·23 cites·5 claims
- 1356US6333251B1Method of fabricating gate structure of semiconductor device for repairing damage to gate oxide layerSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Dec 25, 2001·7 cites·31 claims
- 1451US2015041944A1Image sensor, fabricating method thereof, and device comprising the image sensorKIM HONG-KI·Filed 2014·Application pending·0 cites
- 1548US12179967B2Welding wire accommodation-container coverKISWEL LTD·Filed 2021·Granted Dec 31, 2024·0 cites·6 claims
- 1647US12286325B2Storage container for welding wireKISWEL LTD·Filed 2021·Granted Apr 29, 2025·0 cites·8 claims
- 1741US2023271267A1Retainer ring for welding wireKISWEL LTD·Filed 2021·Application pending·0 cites
- 1839US2005098839A1Semiconductor devices having different gate dielectrics and methods for manufacturing the sameFiled 2004·Application pending·0 cites
- 1938US2004084709A1Capacitor for a semiconductor device and method of fabricating sameSAMSUNG ELECTRONICS CO LTD·Filed 2003·Application pending·0 cites
- 2036US2002033486A1Method for forming an interconnection line using a hydrosilsesquioxane (HSQ) layer as an interlayer insulating layerSAMSUNG ELECTRONICS CO LTD·Filed 2001·Application pending·0 cites
- 2135US2003064169A1Plasma enhanced chemical vapor deposition apparatus and method of producing carbon nanotube using the sameFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →