Inventor · disambiguated record

Hong-Ji Lee

Also filed as: LEE HONG · LEE HONG-JI

40 granted patents·5 pending applications·350 citations·filing 1996–2023

97Inventor score

Technology areasH10P H10W H10D H10B C09B

Files withMACRONIX INT CO LTD25 SAMSUNG ELECTRONICS CO LTD8 NANO ARCHITECT RES CORP4 LEE HONG-JI3 IND TECH RES INST2

Top patents by PatentIndex Score

45 records

0198US8383512B2Method for making multilayer connection structureMACRONIX INT CO LTD·Filed 2011·Granted Feb 26, 2013·58 cites·16 claims
0292US6451161B1Method and apparatus for generating high-density uniform plasmaNANO ARCHITECT RES CORP·Filed 2000·Granted Sep 17, 2002·103 cites·21 claims
0387US6319858B1Methods for reducing a dielectric constant of a dielectric film and for forming a low dielectric constant porous filmNANO ARCHITECT RES CORP·Filed 2000·Granted Nov 20, 2001·50 cites·29 claims
0483US5958087APreparation of cyanine dye for high density optical recording diskIND TECH RES INST·Filed 1999·Granted Sep 28, 1999·23 cites·15 claims
0579US9012282B2Self-aligned liner method of avoiding PL gate damageMACRONIX INT CO LTD·Filed 2013·Granted Apr 21, 2015·5 cites·17 claims
0677US6398430B1Semiconductor device fabrication systemSAMSUNG ELECTRONICS CO LTD·Filed 2000·Granted Jun 4, 2002·19 cites·15 claims
0775US9269660B2Multilayer connection structureMACRONIX INT CO LTD·Filed 2013·Granted Feb 23, 2016·3 cites·10 claims
0872US7629583B2Method and apparatus for analyzing a photoresist filmSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Dec 8, 2009·4 cites·4 claims
0971US7842981B2Semiconductor device and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2008·Granted Nov 30, 2010·4 cites·7 claims
1070US7427519B2Method of detecting end point of plasma etching processMACRONIX INT CO LTD·Filed 2007·Granted Sep 23, 2008·3 cites·20 claims
1168US9425086B2Method of controlling contact hole profile for metal fill-inMACRONIX INT CO LTD·Filed 2013·Granted Aug 23, 2016·2 cites·20 claims
1268US5900348ACyanine dyes mixture as optical recording mediaUNIV TSINGHUA·Filed 1997·Granted May 4, 1999·12 cites·15 claims
1367US7435681B2Methods of etching stacks having metal layers and hard mask layersMACRONIX INT CO LTD·Filed 2006·Granted Oct 14, 2008·2 cites·20 claims
1465US8304175B2Patterning methodLEE HONG-JI·Filed 2009·Granted Nov 6, 2012·2 cites·18 claims
1565US6589706B1Preparation of cyanine dye for high density optical recording diskIND TECH RES INST·Filed 2000·Granted Jul 8, 2003·6 cites·17 claims
1665US6462483B1Induction plasma processing chamberNANO ARCHITECT RES CORP·Filed 1999·Granted Oct 8, 2002·20 cites·12 claims
1763US7550390B2Method and apparatus for dielectric etching during integrated circuit fabricationMACRONIX INT CO LTD·Filed 2006·Granted Jun 23, 2009·2 cites·20 claims
1862US9449915B2Semiconductor device and method of manufacturing the sameMACRONIX INT CO LTD·Filed 2014·Granted Sep 20, 2016·1 cites·17 claims
1961US9305840B2Cluster system for eliminating barrier overhangMACRONIX INT CO LTD·Filed 2013·Granted Apr 5, 2016·2 cites·20 claims
2061US6358672B2Method of forming semiconductor device pattern including cross-linking and flow baking a positive photoresistSAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Mar 19, 2002·24 cites·9 claims
2160US12484227B2Memory device with source line over a bonding padMACRONIX INT CO LTD·Filed 2022·Granted Nov 25, 2025·0 cites·13 claims
2259US9922876B1Interconnect structure and fabricating method thereofMACRONIX INT CO LTD·Filed 2017·Granted Mar 20, 2018·1 cites·17 claims
2358US9224803B2Formation of a high aspect ratio contact holeMACRONIX INT CO LTD·Filed 2013·Granted Dec 29, 2015·1 cites·15 claims
2455US12048154B2Memory device and manufacturing method thereofMACRONIX INT CO LTD·Filed 2021·Granted Jul 23, 2024·0 cites·9 claims
2553US2024164099A1Memory device and method for forming the sameMACRONIX INT CO LTD·Filed 2023·Application pending·0 cites
2652US7494761B2Cyclodextrin derivative, photoresist composition including the cyclodextrin derivative and method of forming a pattern using the photoresist compositionSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Feb 24, 2009·0 cites·11 claims
2749US11510579B2Apparatus and method for determining calibration timing for blood pressure measurement in electronic deviceSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Nov 29, 2022·0 cites·9 claims
2847US9337036B2Method of forming copper sulfide film for reducing copper oxidization and lossMACRONIX INT CO LTD·Filed 2014·Granted May 10, 2016·0 cites·20 claims
2947US9299667B2Method of shaping densely arranged PL gates and peripheral MOS gates for ILD oxide fill-inMACRONIX INT CO LTD·Filed 2014·Granted Mar 29, 2016·0 cites·11 claims
3046US9287285B2Self-aligned liner method of avoiding PL gate damageMACRONIX INT CO LTD·Filed 2015·Granted Mar 15, 2016·0 cites·18 claims
3146US2008311527A1Method of forming protection layer on photoresist pattern and method of forming fine pattern using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
3245US8372714B2Semiconductor device and method of manufacturing a semiconductor deviceMACRONIX INT CO LTD·Filed 2010·Granted Feb 12, 2013·0 cites·12 claims
3345US7410593B2Plasma etching methods using nitrogen memory species for sustaining glow dischargeMACRONIX INT CO LTD·Filed 2006·Granted Aug 12, 2008·0 cites·17 claims
3444US8697340B2Semiconductor structure and method of fabricating the sameLEE HONG-JI·Filed 2008·Granted Apr 15, 2014·0 cites·18 claims
3543US2016190334A1Memory device and method of manufacturing the sameMACRONIX INT CO LTD·Filed 2014·Application pending·0 cites
3643US2016064479A1Semiconductor device and manufacturing method of the sameMACRONIX INT CO LTD·Filed 2014·Application pending·0 cites
3742US10204859B2Interconnect structure and fabricating method thereofMACRONIX INT CO LTD·Filed 2017·Granted Feb 12, 2019·0 cites·20 claims
3842US8445346B2Method of reducing wordline shortingLEE HONG-JI·Filed 2009·Granted May 21, 2013·0 cites·21 claims
3942US8076778B2Method for preventing Al-Cu bottom damage using TiN linerWEI KUO LIANG·Filed 2009·Granted Dec 13, 2011·0 cites·16 claims
4037US10424593B2Three-dimensional non-volatile memory and manufacturing method thereofMACRONIX INT CO LTD·Filed 2018·Granted Sep 24, 2019·0 cites·19 claims
4137US5848315ADevelopment monitoring apparatus and method adopting the sameSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Dec 8, 1998·1 cites·5 claims
4236US9881809B2Semiconductor device and method of fabricating the sameMACRONIX INT CO LTD·Filed 2015·Granted Jan 30, 2018·0 cites·4 claims
4334US2002121345A1Multi-chamber system for semiconductor processNANO ARCHITECT RES CORP·Filed 2001·Application pending·0 cites
4433US9627247B2Semiconductor device and method of fabricating the sameMACRONIX INT CO LTD·Filed 2015·Granted Apr 18, 2017·0 cites·8 claims
4529US5698644AProcess for preparing syndiotactic vinyl aromatic polymers under high pressure inert gasNAT SCIENCE COUNCIL·Filed 1997·Granted Dec 16, 1997·2 cites·5 claims

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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →