Inventor · disambiguated record
Homayoun Talleh
Also filed as: TALIEH HOMAYOUN · TALLEH HOMAYOUN
1 granted patent·2 pending applications·13 citations·filing 2001–2003
38Inventor score
Files withNUTOOL INC1
Top patents by PatentIndex Score
3 records- 0174US6579800B2Chemical mechanical polishing endpoint detectionNUTOOL INC·Filed 2001·Granted Jun 17, 2003·13 cites·15 claims
- 0237US2004102049A1Method and system to provide material removal and planarization employing a reactive padFiled 2003·Application pending·0 cites
- 0332US2003213558A1Chemical mechanical polishing endpoint detectionFiled 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →