Inventor · disambiguated record
Hong Xiao
Also filed as: XIAO HONG · XIAO HONG YONG
62 granted patents·11 pending applications·1,471 citations·filing 1999–2025
98Inventor score
Files withXIAO HONG15KLA TENCOR CORP12HERMES MICROVISION INC9SHENZHEN FUTAIHONG PREC IND CO5FANG WEI2
Top patents by PatentIndex Score
73 records- 0198US8748814B1Structure for inspecting defects in word line array fabricated by SADP process and method thereofHERMES MICROVISION INC·Filed 2013·Granted Jun 10, 2014·63 cites·16 claims
- 0298US8421009B2Test structure for charged particle beam inspection and method for defect determination using the sameXIAO HONG·Filed 2009·Granted Apr 16, 2013·81 cites·20 claims
- 0398US8299463B2Test structure for charged particle beam inspection and method for defect determination using the sameXIAO HONG·Filed 2010·Granted Oct 30, 2012·62 cites·29 claims
- 0498USD558460SDigital photo frameSHENZHEN FUTAIHONG PREC IND CO·Filed 2006·Granted Jan 1, 2008·488 cites·1 claims
- 0597US8754372B2Structure and method for determining a defect in integrated circuit manufacturing processXIAO HONG·Filed 2011·Granted Jun 17, 2014·81 cites·4 claims
- 0697US8089297B2Structure and method for determining a defect in integrated circuit manufacturing processXIAO HONG·Filed 2008·Granted Jan 3, 2012·92 cites·9 claims
- 0796US8716662B1Methods and apparatus to review defects using scanning electron microscope with multiple electron beam configurationsMACDONALD PAUL·Filed 2012·Granted May 6, 2014·132 cites·8 claims
- 0896USD569629SDigital photo frameSHENZHEN FUTAIHONG PREC IND CO·Filed 2006·Granted May 27, 2008·89 cites·1 claims
- 0996USD563379SMobile phoneSHENZHEN FUTAIHONG PREC IND CO·Filed 2007·Granted Mar 4, 2008·109 cites·1 claims
- 1091US6153709AChip resistant, vibration damping coatings for vehiclesESSEX SPECIALTY PROD·Filed 1999·Granted Nov 28, 2000·91 cites·19 claims
- 1189US7919760B2Operation stage for wafer edge inspection and reviewHERMES MICROVISION INC·Filed 2008·Granted Apr 5, 2011·15 cites·10 claims
- 1288US7784165B2Method of forming a panel constrained layer damper treatmentMATERIAL SCIENCE CORP·Filed 2006·Granted Aug 31, 2010·16 cites·22 claims
- 1387US10018579B1System and method for cathodoluminescence-based semiconductor wafer defect inspectionKLA TENCOR CORP·Filed 2016·Granted Jul 10, 2018·6 cites·24 claims
- 1487US8759762B2Method and apparatus for identifying plug-to-plug short from a charged particle microscopic imageXIAO HONG·Filed 2009·Granted Jun 24, 2014·13 cites·20 claims
- 1585US12125992B11.5V lithium battery and manufacturing method thereofHAMEDATA TECH CO LIMITED·Filed 2024·Granted Oct 22, 2024·1 cites·9 claims
- 1685US9282293B2Method and system for measuring critical dimension and monitoring fabrication uniformityHERMES MICROVISION INC·Filed 2013·Granted Mar 8, 2016·4 cites·14 claims
- 1785US7846807B2Method for forming memristor material and electrode structure with memristanceHERMES EPITEK CORP·Filed 2009·Granted Dec 7, 2010·12 cites·20 claims
- 1885USD558788SMultimedia playerSHENZHEN FUTAIHONG PREC IND CO·Filed 2006·Granted Jan 1, 2008·33 cites·1 claims
- 1983US8092641B1System and method for removing organic residue from a charged particle beam systemXIAO HONG·Filed 2005·Granted Jan 10, 2012·6 cites·10 claims
- 2082US9696268B2Automated decision-based energy-dispersive x-ray methodology and apparatusKLA TENCOR CORP·Filed 2015·Granted Jul 4, 2017·3 cites·16 claims
- 2182US9100553B2Method and system for measuring critical dimension and monitoring fabrication uniformityHERMES MICROVISION INC·Filed 2013·Granted Aug 4, 2015·3 cites·7 claims
- 2282US8377553B2Constrained layer damper, and related methodsMATERIAL SCIENCES CORP·Filed 2008·Granted Feb 19, 2013·5 cites·19 claims
- 2381US10020979B1Allocating resources in multi-core computing environmentsA10 NETWORKS INC·Filed 2014·Granted Jul 10, 2018·6 cites·20 claims
- 2481US9041795B2Method and system for measuring critical dimension and monitoring fabrication uniformityHERMES MICROVISION INC·Filed 2013·Granted May 26, 2015·3 cites·6 claims
- 2581US8723115B2Method and apparatus for detecting buried defectsXIAO HONG·Filed 2012·Granted May 13, 2014·4 cites·14 claims
- 2678US9153120B1Systems and methods for locating lost devicesSYMANTEC CORP·Filed 2013·Granted Oct 6, 2015·9 cites·20 claims
- 2776US9257260B2Method and system for adaptively scanning a sample during electron beam inspectionKLA TENCOR CORP·Filed 2014·Granted Feb 9, 2016·3 cites·34 claims
- 2876US8809779B2Method and system for heating substrate in vacuum environment and method and system for identifying defects on substrateXIAO HONG·Filed 2008·Granted Aug 19, 2014·5 cites·23 claims
- 2976US8432441B2Method and system for measuring critical dimension and monitoring fabrication uniformityFANG WEI·Filed 2011·Granted Apr 30, 2013·3 cites·4 claims
- 3076US8010307B2In-line overlay measurement using charged particle beam systemHERMES MICROVISION INC·Filed 2007·Granted Aug 30, 2011·5 cites·13 claims
- 3174US8050490B2Method for inspecting overlay shift defect during semiconductor manufacturing and apparatus thereofHERMES MICROVISION INC·Filed 2009·Granted Nov 1, 2011·4 cites·25 claims
- 3273US9116109B2Method and apparatus for detecting buried defectsKLA TENCOR CORP·Filed 2014·Granted Aug 25, 2015·2 cites·2 claims
- 3372US10446367B2Scan strategies to minimize charging effects and radiation damage of charged particle beam metrology systemKLA TENCOR CORP·Filed 2018·Granted Oct 15, 2019·1 cites·20 claims
- 3471US7981243B2Method of manufacturing laminated damping structure with vulcanized rubber as viscoelastic coreMATERIAL SCIENCE CORP·Filed 2008·Granted Jul 19, 2011·1 cites·20 claims
- 3570US10768533B2Method and system for generating programmed defects for use in metrology measurementsKLA TENCOR CORP·Filed 2017·Granted Sep 8, 2020·1 cites·38 claims
- 3668US8193491B2Structure and method for determining a defect in integrated circuit manufacturing processXIAO HONG·Filed 2008·Granted Jun 5, 2012·2 cites·23 claims
- 3768US7737440B2Test structure for charged particle beam inspection and method for fabricating the sameHERMES MICROVISION INC·Filed 2008·Granted Jun 15, 2010·2 cites·9 claims
- 3865US12230818B1Voltage-reduced lithium battery and manufacturing method thereofHAMEDATA TECH CO LIMITED·Filed 2024·Granted Feb 18, 2025·0 cites·8 claims
- 3965US9318395B2Systems and methods for preparation of samples for sub-surface defect reviewKLA TENCOR CORP·Filed 2012·Granted Apr 19, 2016·2 cites·20 claims
- 4060US10823679B2Scanning type laser induced spectrum analysis and detection systemACAD OPTO ELECTRONICS CAS·Filed 2016·Granted Nov 3, 2020·1 cites·7 claims
- 4158US12483604B2Communication method and apparatus, device, system, chip and storage mediumCHINA SATELLITE NETWORK EXPLOR CO LTD·Filed 2025·Granted Nov 25, 2025·0 cites·15 claims
- 4257US7288632B2Dropsophila tumor necrosis factor class molecule (“DmTNFv2”)BRISTOL MYERS SQUIBB CO·Filed 2005·Granted Oct 30, 2007·0 cites·11 claims
- 4356US11914290B2Overlay measurement targets designKLA CORP·Filed 2020·Granted Feb 27, 2024·0 cites·19 claims
- 4456US7037676B2Drosophila tumor necrosis factor class molecule polynucleotides and variants thereofBRISTOL MYERS SQUIBB·Filed 2001·Granted May 2, 2006·2 cites·22 claims
- 4556US2007264324A1Use of Vegetable Anthraquinone Derivatives and Vegetable Polysaccharides For Treating Human Immunodeficiency Virus (HIV)YANG ZHANQIU·Filed 2007·Application pending·0 cites
- 4655US10948295B2Auto phase control drive circuit for gyroscope apparatusPANASONIC IP MAN CO LTD·Filed 2019·Granted Mar 16, 2021·0 cites·6 claims
- 4755US2009148712A1Viscoelastic composition and damper, and related methodsXIAO HONG·Filed 2008·Application pending·0 cites
- 4854US9449788B2Enhanced defect detection in electron beam inspection and reviewKLA TENCOR CORP·Filed 2014·Granted Sep 20, 2016·1 cites·18 claims
- 4954US8952435B2Method for forming memory cell transistorXIAO HONG·Filed 2009·Granted Feb 10, 2015·0 cites·7 claims
- 5053US2008209907A1Solar-architectural material and building integrative solar energy utilizationXIAO WENZHAO·Filed 2007·Application pending·0 cites
Showing the top 50 of 73 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →