Inventor · disambiguated record
Hsiao-Lin Hsu
Also filed as: HSU HSIAO-LIN
6 granted patents·8 citations·filing 2017–2018
73Inventor score
Files withUNITED MICROELECTRONICS CORP6
Top patents by PatentIndex Score
6 records- 0188US10177094B1Measurement mark and method for monitoring semiconductor processUNITED MICROELECTRONICS CORP·Filed 2018·Granted Jan 8, 2019·4 cites·13 claims
- 0276US10170369B1Semiconductor device and fabrication method thereofUNITED MICROELECTRONICS CORP·Filed 2017·Granted Jan 1, 2019·2 cites·9 claims
- 0373US10529667B1Method of forming overlay mark structureUNITED MICROELECTRONICS CORP·Filed 2018·Granted Jan 7, 2020·2 cites·14 claims
- 0456US10600692B2Semiconductor deviceUNITED MICROELECTRONICS CORP·Filed 2018·Granted Mar 24, 2020·0 cites·5 claims
- 0555US10373915B1Method for monitoring semiconductor processUNITED MICROELECTRONICS CORP·Filed 2018·Granted Aug 6, 2019·0 cites·6 claims
- 0643US10395999B1Method for monitoring fin removalUNITED MICROELECTRONICS CORP·Filed 2018·Granted Aug 27, 2019·0 cites·15 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →