Inventor · disambiguated record
Hsueh-Wen Wang
Also filed as: WANG HSUEH-WEN
8 granted patents·87 citations·filing 1999–2017
85Inventor score
Top patents by PatentIndex Score
8 records- 0197US9722093B1Oxide semiconductor transistor and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2016·Granted Aug 1, 2017·47 cites·13 claims
- 0293US10056463B2Transistor and manufacturing method thereofUNITED MICROELECTRONICS CORP·Filed 2017·Granted Aug 21, 2018·13 cites·18 claims
- 0390US9607982B1Semiconductor device and method for fabricating the sameUNITED MICROELECTRONICS CORP·Filed 2016·Granted Mar 28, 2017·8 cites·20 claims
- 0459US6451680B1Method for reducing borderless contact leakage by OPCUNITED MICROELECTRONICS CORP·Filed 2001·Granted Sep 17, 2002·6 cites·10 claims
- 0555US6489196B1Method of forming a capacitor with high capacitance and low voltage coefficientUNITED ELECTRONICS CORP·Filed 2002·Granted Dec 3, 2002·9 cites·12 claims
- 0641US7514278B2Test-key for checking interconnect and corresponding checking methodUNITED MICROELECTRONICS CORP·Filed 2005·Granted Apr 7, 2009·0 cites·11 claims
- 0740US8278765B2Test-key for checking interconnectCHENG YEH-SHENG·Filed 2008·Granted Oct 2, 2012·0 cites·17 claims
- 0831US6534415B2Method of removing polymer residues after tungsten etch backUNITED MICROELECTRONICS CORP·Filed 1999·Granted Mar 18, 2003·4 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →