Inventor · disambiguated record
Hung T. Nguyen
Also filed as: NGUYEN HUNG · NGUYEN HUNG T · NGUYEN HUNG THE · NGUYEN HUNG THE HAC
14 granted patents·7 pending applications·150 citations·filing 2002–2024
92Inventor score
Top patents by PatentIndex Score
21 records- 0191US8033772B2Transfer chamber for vacuum processing systemAPPLIED MATERIALS INC·Filed 2006·Granted Oct 11, 2011·15 cites·31 claims
- 0290US7018517B2Transfer chamber for vacuum processing systemAPPLIED MATERIALS INC·Filed 2003·Granted Mar 28, 2006·39 cites·30 claims
- 0389US6833717B1Electron beam test system with integrated substrate transfer moduleAPPLIED MATERIALS INC·Filed 2004·Granted Dec 21, 2004·35 cites·30 claims
- 0482US7746088B2In-line electron beam test systemAPPLIED MATERIALS INC·Filed 2009·Granted Jun 29, 2010·6 cites·20 claims
- 0580US6824343B2Substrate supportAPPLIED MATERIALS INC·Filed 2002·Granted Nov 30, 2004·20 cites·28 claims
- 0679US7535238B2In-line electron beam test systemAPPLIED MATERIALS INC·Filed 2006·Granted May 19, 2009·5 cites·25 claims
- 0773US7919972B2Integrated substrate transfer moduleAPPLIED MATERIALS INC·Filed 2008·Granted Apr 5, 2011·5 cites·20 claims
- 0870US7786742B2Prober for electronic device testing on large area substratesAPPLIED MATERIALS INC·Filed 2007·Granted Aug 31, 2010·2 cites·18 claims
- 0968US7735710B2Substrate supportAPPLIED MATERIALS INC·Filed 2004·Granted Jun 15, 2010·10 cites·11 claims
- 1067US7602199B2Mini-prober for TFT-LCD testingAPPLIED MATERIALS INC·Filed 2007·Granted Oct 13, 2009·1 cites·19 claims
- 1165US7973546B2In-line electron beam test systemAPPLIED MATERIALS INC·Filed 2010·Granted Jul 5, 2011·1 cites·20 claims
- 1265US7330021B2Integrated substrate transfer moduleAPPLIED MATERIALS INC·Filed 2004·Granted Feb 12, 2008·6 cites·22 claims
- 1355US7505832B2Method and apparatus for determining a substrate exchange position in a processing systemAPPLIED MATERIALS INC·Filed 2004·Granted Mar 17, 2009·5 cites·18 claims
- 1454US2025280493A1Vertical conductive structure transition impedance optimizationIBM·Filed 2024·Application pending·0 cites
- 1553US2020106012A1Methods of forming nickel-containing filmsAPPLIED MATERIALS INC·Filed 2019·Application pending·0 cites
- 1647US2010098518A1In/out door for a vacuum chamberAPPLIED MATERIALS INC·Filed 2008·Application pending·0 cites
- 1746US11450525B2Selective aluminum oxide film depositionAPPLIED MATERIALS INC·Filed 2018·Granted Sep 20, 2022·0 cites·14 claims
- 1843US2008251019A1System and method for transferring a substrate into and out of a reduced volume chamber accommodating multiple substratesKRISHNASWAMI SRIRAM·Filed 2007·Application pending·0 cites
- 1936US2006273815A1Substrate support with integrated prober driveAPPLIED MATERIALS INC·Filed 2005·Application pending·0 cites
- 2036US2006038554A1Electron beam test system stageAPPLIED MATERIALS INC·Filed 2005·Application pending·0 cites
- 2135US2012113559A1Electrostatic discharge prevention for large area substrate processing systemNGUYEN HUNG T·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →