Inventor · disambiguated record
Hui-Pin Yang
Also filed as: YANG HUI · YANG HUI-PIN
12 granted patents·10 pending applications·77 citations·filing 1998–2025
86Inventor score
Top patents by PatentIndex Score
22 records- 0182US2025172589A1Probe system, probe card, probe head, and probe for testing electronic device under test integrated on a semiconductor wafer, and electronic device under test tested by the probe cardMPI CORP·Filed 2024·Application pending·0 cites
- 0282US2025147072A1Probe card, probe head, method for manufacturing the probe head, and electronic device under test tested by the probe cardMPI CORP·Filed 2024·Application pending·0 cites
- 0380US2024393368A1Probe system for testing of devices under test integrated on a semiconductor wafer, and probe card, probe head, and guiding plate structure thereinMPI CORP·Filed 2024·Application pending·0 cites
- 0480US2024393367A1Probe system for testing of devices under test integrated on a semiconductor wafer, and probe card, probe head, and guiding plate structure thereinMPI CORP·Filed 2024·Application pending·0 cites
- 0576US11150269B2Probe head for high frequency signal test and medium or low frequency signal test at the same timeMPI CORP·Filed 2020·Granted Oct 19, 2021·1 cites·18 claims
- 0672US5835367ADistributed plannar-type high voltage transformerIND TECH RES INST·Filed 1998·Granted Nov 10, 1998·47 cites·12 claims
- 0771US9201098B2High frequency probe cardMPI CORP·Filed 2013·Granted Dec 1, 2015·3 cites·20 claims
- 0866US2025231219A1Testing method, device under test, probe card and probe system for micro-bump testMPI CORP·Filed 2025·Application pending·0 cites
- 0964US5847947AHigh voltage transformerIND TECH RES INST·Filed 1998·Granted Dec 8, 1998·22 cites·10 claims
- 1063US2025208168A1Probe head, probe card, test equipment, and electronic device tested by the test equipmentMPI CORP·Filed 2024·Application pending·0 cites
- 1161US2024402218A1Probe system for testing device under test integrated in semiconductor wafer, and probe card, probe head and guide plate structure thereofMPI CORP·Filed 2024·Application pending·0 cites
- 1250US12222330B2Large-scale direct shear apparatus for direct shear test of multi-size cylindrical undisturbed soil samplesUNIV FUZHOU·Filed 2022·Granted Feb 11, 2025·0 cites·5 claims
- 1349US11774468B2Vertical probe headMPI CORP·Filed 2022·Granted Oct 3, 2023·0 cites·21 claims
- 1447US11346860B2Probe head for high frequency signal test and medium or low frequency signal test at the same timeMPI CORP·Filed 2020·Granted May 31, 2022·0 cites·17 claims
- 1545US9535093B2High frequency probe card for probing photoelectric deviceMPI CORP·Filed 2014·Granted Jan 3, 2017·0 cites·17 claims
- 1644US7661686B2Steering structure of a walk-substituting cartSUNPEX TECHNOLOGY CO LTD·Filed 2006·Granted Feb 16, 2010·0 cites·5 claims
- 1744US6984998B2Multi-function probe cardMJC PROBE INC·Filed 2004·Granted Jan 10, 2006·4 cites·10 claims
- 1843US9244018B2Probe holding structure and optical inspection device equipped with the sameMPI CORP·Filed 2013·Granted Jan 26, 2016·0 cites·24 claims
- 1939US9442135B2Method of manufacturing space transformer for probe cardMPI CORP·Filed 2014·Granted Sep 13, 2016·0 cites·14 claims
- 2038US2014016124A1Optical inspection deviceMPI CORP·Filed 2013·Application pending·0 cites
- 2135US2006279060A1Structure of a locking device for a fork of a cart for use by elderly and handicapped personsYANG HUI-PIN·Filed 2005·Application pending·0 cites
- 2232US2006278511A1Switch of an actuating mechanism of a cart for use by elderly and handicapped personsYANG HUI-PIN·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →