Inventor · disambiguated record
Hyunui Lee
Also filed as: LEE HYUNUI
22 granted patents·2 pending applications·31 citations·filing 2016–2025
92Inventor score
Top patents by PatentIndex Score
24 records- 0191US11145383B1Impedance calibration via a number of calibration circuits, and associated methods, devices, and systemsMICRON TECHNOLOGY INC·Filed 2020·Granted Oct 12, 2021·3 cites·24 claims
- 0291US10790039B1Semiconductor device having a test circuitMICRON TECHNOLOGY INC·Filed 2019·Granted Sep 29, 2020·7 cites·20 claims
- 0386US9870808B2Memory device for performing calibration operationSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Jan 16, 2018·8 cites·20 claims
- 0483US10839889B1Apparatuses and methods for providing clocks to data pathsMICRON TECHNOLOGY INC·Filed 2019·Granted Nov 17, 2020·3 cites·20 claims
- 0583US10078110B2Short circuit detecting device of stacked memory chips and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Sep 18, 2018·3 cites·20 claims
- 0679US11670397B2Output impedance calibration, and related devices, systems, and methodsMICRON TECHNOLOGY INC·Filed 2021·Granted Jun 6, 2023·1 cites·20 claims
- 0779US10243584B2Memory device including parity error detection circuitSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Mar 26, 2019·4 cites·12 claims
- 0872US11960906B2Output impedance calibration, and related devices, systems, and methodsMICRON TECHNOLOGY INC·Filed 2022·Granted Apr 16, 2024·0 cites·19 claims
- 0971US10938416B2Memory device including parity error detection circuitSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Mar 2, 2021·1 cites·6 claims
- 1070US10902907B1Output drivers, and related methods, memory devices, and systemsMICRON TECHNOLOGY INC·Filed 2019·Granted Jan 26, 2021·1 cites·20 claims
- 1165US11398266B1Integrated assemblies having memory cells with capacitive units and reference-voltage-generators with resistive unitsMICRON TECHNOLOGY INC·Filed 2021·Granted Jul 26, 2022·0 cites·14 claims
- 1264US11494198B2Output impedance calibration, and related devices, systems, and methodsMICRON TECHNOLOGY INC·Filed 2021·Granted Nov 8, 2022·0 cites·19 claims
- 1363US11922996B2Apparatuses, systems, and methods for ZQ calibrationMICRON TECHNOLOGY INC·Filed 2021·Granted Mar 5, 2024·0 cites·20 claims
- 1463US11646073B2Reference-voltage-generators within integrated assembliesMICRON TECHNOLOGY INC·Filed 2022·Granted May 9, 2023·0 cites·20 claims
- 1562US11848065B2Impedance calibration via a number of calibration circuits, and associated methods, devices and systemsMICRON TECHNOLOGY INC·Filed 2021·Granted Dec 19, 2023·0 cites·20 claims
- 1661US12437826B2Self timing training using majority decision mechanismMICRON TECHNOLOGY INC·Filed 2021·Granted Oct 7, 2025·0 cites·19 claims
- 1759US10908212B2Semiconductor memory device including a shift registerSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Feb 2, 2021·0 cites·19 claims
- 1857US11619964B2Methods for improving timing in memory devices, and related devices and systemsMICRON TECHNOLOGY INC·Filed 2021·Granted Apr 4, 2023·0 cites·17 claims
- 1957US2025274125A1Apparatus including slew rate control circuitMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 2056US11443788B1Reference-voltage-generators within integrated assembliesMICRON TECHNOLOGY INC·Filed 2021·Granted Sep 13, 2022·0 cites·30 claims
- 2154US10509070B2Short circuit detecting device of stacked memory chips and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Dec 17, 2019·0 cites·15 claims
- 2250US11677537B2Signal delay control and related apparatuses, systems, and methodsMICRON TECHNOLOGY INC·Filed 2021·Granted Jun 13, 2023·0 cites·19 claims
- 2348US11302387B2Input/output capacitance measurement, and related methods, devices, and systemsMICRON TECHNOLOGY INC·Filed 2020·Granted Apr 12, 2022·0 cites·20 claims
- 2436US2018026013A1Memory device including interposer and system-in-package including the sameYUN WON-JOO·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →