Inventor · disambiguated record
Ian R. Smith
Also filed as: SMITH IAN R · SMITH IAN RODNEY
21 granted patents·1,362 citations·filing 1981–2003
97Inventor score
Top patents by PatentIndex Score
21 records- 0196US5376790AScanning probe microscopePARK SCIENT INSTR·Filed 1992·Granted Dec 27, 1994·197 cites·57 claims
- 0295US5714756AScanning probe microscope having a single viewing device for on-axis and oblique angle viewsPARK SCIENT INSTR·Filed 1996·Granted Feb 3, 1998·127 cites·19 claims
- 0392US6265718B1Scanning probe microscope with scan correctionTHERMOMICROSCOPES CORP·Filed 2000·Granted Jul 24, 2001·95 cites·4 claims
- 0492US5672816ALarge stage system for scanning probe microscopes and other instrumentsPARK SCIENT INSTR·Filed 1995·Granted Sep 30, 1997·162 cites·23 claims
- 0591US5444244APiezoresistive cantilever with integral tip for scanning probe microscopePARK SCIENT INSTR CORP·Filed 1993·Granted Aug 22, 1995·114 cites·19 claims
- 0690US6590703B2Optical system for scanning microscopeTHERMOMICROSCOPES CORP·Filed 2001·Granted Jul 8, 2003·34 cites·6 claims
- 0788US5448399AOptical system for scanning microscopePARK SCIENT INSTR·Filed 1992·Granted Sep 5, 1995·58 cites·8 claims
- 0887US4748335AMethod and aparatus for determining surface profilesSISCAN SYSTEMS INC·Filed 1985·Granted May 31, 1988·70 cites·42 claims
- 0987US4689491ASemiconductor wafer scanning systemDATASONICS CORP·Filed 1985·Granted Aug 25, 1987·108 cites·25 claims
- 1085US5184021AMethod and apparatus for measuring the dimensions of patterned features on a lithographic photomaskSISCAN SYSTEMS INC·Filed 1991·Granted Feb 2, 1993·53 cites·18 claims
- 1184US5939719AScanning probe microscope with scan correctionTHERMOMICROSCOPES CORP·Filed 1997·Granted Aug 17, 1999·44 cites·31 claims
- 1284US5496999AScanning probe microscopeFiled 1994·Granted Mar 5, 1996·56 cites·42 claims
- 1384US4707610AMethod and apparatus for measuring surface profilesSISCAN SYSTEMS INC·Filed 1986·Granted Nov 17, 1987·45 cites·23 claims
- 1479US4634880AConfocal optical imaging system with improved signal-to-noise ratioSISCAN SYSTEMS INC·Filed 1986·Granted Jan 6, 1987·45 cites·8 claims
- 1573US6057547AScanning probe microscope with scan correctionTHERMOMICROSCOPES CORP·Filed 1998·Granted May 2, 2000·50 cites·9 claims
- 1671US5877891AScanning probe microscope having a single viewing device for on-axis and oblique optical viewsPARK SCIENT INSTR·Filed 1995·Granted Mar 2, 1999·27 cites·22 claims
- 1770US6130427AScanning probe microscope with multimode headPARK SCIENT INSTR·Filed 1997·Granted Oct 10, 2000·24 cites·35 claims
- 1868US5838349AElectrohydrodynamic ink jet printer and printing methodNATURAL IMAGING CORP·Filed 1997·Granted Nov 17, 1998·31 cites·44 claims
- 1962US4847823AMethod and apparatus for reading or measuring magneto-optical storage media using pinhole apertureSISCAN SYSTEMS INC·Filed 1987·Granted Jul 11, 1989·13 cites·12 claims
- 2047US7512248B2Method of incorporating a secondary image into a primary imageNAUTILUS GB LTD·Filed 2003·Granted Mar 31, 2009·4 cites·4 claims
- 2140US4367648ADark field viewing apparatusNAT RES DEV·Filed 1981·Granted Jan 11, 1983·5 cites·32 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →