Inventor · disambiguated record
Ichiro Honjo
Also filed as: HONJO ICHIRO
10 granted patents·442 citations·filing 1987–2017
91Inventor score
Top patents by PatentIndex Score
10 records- 0196US5557105APattern inspection apparatus and electron beam apparatusFUJITSU LTD·Filed 1994·Granted Sep 17, 1996·150 cites·7 claims
- 0296US5430292APattern inspection apparatus and electron beam apparatusFUJITSU LTD·Filed 1993·Granted Jul 4, 1995·152 cites·47 claims
- 0388US5384463APattern inspection apparatus and electron beam apparatusFUJISU LIMITED·Filed 1994·Granted Jan 24, 1995·70 cites·7 claims
- 0471US8921782B2Tilt-imaging scanning electron microscopeKLA TENCOR CORP·Filed 2013·Granted Dec 30, 2014·2 cites·19 claims
- 0566US4748646AX-ray lithography systemFUJITSU LTD·Filed 1987·Granted May 31, 1988·17 cites·4 claims
- 0664US6188167B1Micro electron beam source and a fabrication process thereofFUJITSU LTD·Filed 1997·Granted Feb 13, 2001·17 cites·3 claims
- 0757US6130429AMiniaturized secondary electron detectorFUJITSU LTD·Filed 1998·Granted Oct 10, 2000·15 cites·20 claims
- 0854US5731228AMethod for making micro electron beam sourceFUJITSU LTD·Filed 1995·Granted Mar 24, 1998·11 cites·13 claims
- 0954US4789786AMethod of projecting photoelectron imageFUJITSU LTD·Filed 1988·Granted Dec 6, 1988·8 cites·6 claims
- 1040US10790114B2Scanning electron microscope objective lens calibration using X-Y voltages iteratively determined from images obtained using said voltagesKLA TENCOR CORP·Filed 2017·Granted Sep 29, 2020·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →