Inventor · disambiguated record
Iftach Galon
Also filed as: GALON IFTACH
1 granted patent·2 pending applications·0 citations·filing 2023–2024
9Inventor score
Files withKLA CORP3
Top patents by PatentIndex Score
3 records- 0172US2024337952A1System and method for determining overlay measurement of a scanning targetKLA CORP·Filed 2023·Application pending·0 cites
- 0263US12373936B2System and method for overlay metrology using a phase maskKLA CORP·Filed 2023·Granted Jul 29, 2025·0 cites·38 claims
- 0355US2025314482A1Focus position measurement while scanningKLA CORP·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →