Inventor · disambiguated record
In Buhm Chung
Also filed as: CHUNG IN BUHM
1 granted patent·2 pending applications·2 citations·filing 2008–2010
18Inventor score
Top patents by PatentIndex Score
3 records- 0147US7868636B2Probe card and method for fabricating the sameAMST CO LTD·Filed 2008·Granted Jan 11, 2011·2 cites·18 claims
- 0231US2010207652A1Method for wafer test and probe card for the sameAMST CO LTD·Filed 2008·Application pending·0 cites
- 0329US2012081140A1Probe cardSHIM YUN HEE·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →