Inventor · disambiguated record
Isamu Inomata
Also filed as: INOMATA ISAMU
6 granted patents·21 citations·filing 2000–2015
76Inventor score
Top patents by PatentIndex Score
6 records- 0184US9684014B2Prober for inspecting semiconductor devices formed on semiconductor waferTOKYO ELECTRON LTD·Filed 2015·Granted Jun 20, 2017·3 cites·7 claims
- 0283US7688096B2Contact load measuring apparatus and inspecting apparatusTOKYO ELECTRON LTD·Filed 2005·Granted Mar 30, 2010·13 cites·4 claims
- 0370US8081007B2Inspection apparatus and method for inspecting electric characteristics of devices formed on target objectYAMAMOTO YASUHITO·Filed 2008·Granted Dec 20, 2011·4 cites·6 claims
- 0443US9261553B2Probe apparatusTOKYO ELECTRON LTD·Filed 2014·Granted Feb 16, 2016·0 cites·14 claims
- 0543US8536891B2Inspection method for inspecting electric characteristics of devices formed on target objectYAMAMOTO YASUHITO·Filed 2011·Granted Sep 17, 2013·0 cites·7 claims
- 0642US6433566B1Probing method and probing systemTOKYO ELECTRON LTD·Filed 2000·Granted Aug 13, 2002·1 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →