Inventor · disambiguated record
Itaru Iida
Also filed as: IIDA ITARU
5 granted patents·3 pending applications·271 citations·filing 1995–2014
83Inventor score
Top patents by PatentIndex Score
8 records- 0192US5568054AProbe apparatus having burn-in test functionTOKYO ELECTRON LTD·Filed 1995·Granted Oct 22, 1996·120 cites·22 claims
- 0285US6268740B1System for testing semiconductor device formed on semiconductor waferTOKYO ELECTRON LTD·Filed 1999·Granted Jul 31, 2001·72 cites·21 claims
- 0379US5691764AApparatus for examining target objects such as LCD panelsTOKYO ELECTRON LTD·Filed 1995·Granted Nov 25, 1997·63 cites·19 claims
- 0452US6380753B1Screening method of semiconductor device and apparatus thereofTOKYO ELECTRON LTD·Filed 1999·Granted Apr 30, 2002·16 cites·12 claims
- 0544US8546185B2Method for manufacturing semiconductor deviceNAKAO KEN·Filed 2012·Granted Oct 1, 2013·0 cites·3 claims
- 0640US2013181040A1Semiconductor device manufacturing system and semiconductor device manufacturing methodTOKYO ELECTRON LTD·Filed 2012·Application pending·0 cites
- 0740US2014239484A1Method for forming sintered silver coating film, baking apparatus, and semiconductor deviceTOKYO ELECTRON LTD·Filed 2014·Application pending·0 cites
- 0836US2015214088A1Pickup method and pickup deviceNAKAO KEN·Filed 2011·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →