Inventor · disambiguated record
Ivan Lazic
Also filed as: LAZIC IVAN · LAZIĆ IVAN
12 granted patents·2 pending applications·50 citations·filing 2013–2023
88Inventor score
Files withFEI CO14
Top patents by PatentIndex Score
14 records- 0193US10446366B1Imaging technique in scanning transmission charged particle microscopyFEI CO·Filed 2018·Granted Oct 15, 2019·13 cites·20 claims
- 0293US9312098B2Method of examining a sample in a charged-particle microscopeFEI CO·Filed 2015·Granted Apr 12, 2016·16 cites·20 claims
- 0386US10607811B1Multi-beam scanning transmission charged particle microscopeFEI CO·Filed 2019·Granted Mar 31, 2020·4 cites·12 claims
- 0483US10403469B2Method of performing tomographic imaging in a charged-particle microscopeFEI CO·Filed 2016·Granted Sep 3, 2019·3 cites·19 claims
- 0578US11211223B1System and method for simultaneous phase contrast imaging and electron energy-loss spectroscopyFEI CO·Filed 2020·Granted Dec 28, 2021·1 cites·20 claims
- 0676US10573488B2Method of performing tomographic imaging in a charged-particle microscopeFEI CO·Filed 2019·Granted Feb 25, 2020·1 cites·18 claims
- 0774US9136087B2Method of investigating and correcting aberrations in a charged-particle lens systemFEI CO·Filed 2013·Granted Sep 15, 2015·3 cites·19 claims
- 0874US8766214B2Method of preparing and imaging a lamella in a particle-optical apparatusFEI CO·Filed 2013·Granted Jul 1, 2014·3 cites·20 claims
- 0973US10699872B2Discriminative imaging technique in scanning transmission charged particle microscopyFEI CO·Filed 2019·Granted Jun 30, 2020·1 cites·12 claims
- 1072US10665419B2Intelligent pre-scan in scanning transmission charged particle microscopyFEI CO·Filed 2019·Granted May 26, 2020·1 cites·12 claims
- 1171US9202670B2Method of investigating the wavefront of a charged-particle beamFEI CO·Filed 2014·Granted Dec 1, 2015·3 cites·19 claims
- 1262US9959639B2Method of ptychographic imagingFEI CO·Filed 2016·Granted May 1, 2018·1 cites·20 claims
- 1360US2025069847A1Differential phase contrast microanalysis using energy loss spectrometersFEI CO·Filed 2023·Application pending·0 cites
- 1455US2023352269A1Method and Scanning Transmission Charged-Particle MicroscopeFEI CO·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →