Inventor · disambiguated record
Iyun Leu
Also filed as: LEU IYUN · LEU IYUN KEVIN
19 granted patents·1 pending application·44 citations·filing 2007–2021
91Inventor score
Top patents by PatentIndex Score
20 records- 0194US11016035B2Smart defect calibration system and the method thereofELITE SEMICONDUCTOR INC·Filed 2018·Granted May 25, 2021·8 cites·14 claims
- 0290US8607169B2Intelligent defect diagnosis methodLEU IYUN·Filed 2011·Granted Dec 10, 2013·14 cites·6 claims
- 0390US8312401B2Method for smart defect screen and sampleLEU IYUN·Filed 2011·Granted Nov 13, 2012·9 cites·11 claims
- 0478US9129237B2Integrated interfacing system and method for intelligent defect yield solutionsLEU IYUN·Filed 2011·Granted Sep 8, 2015·3 cites·23 claims
- 0576US8908957B2Method for building rule of thumb of defect classification, and methods for classifying defect and judging killer defect based on rule of thumb and critical area analysisLEU IYUN·Filed 2011·Granted Dec 9, 2014·3 cites·4 claims
- 0675US11774373B2Smart coordinate conversion and calibration system in semiconductor wafer manufacturingELITE SEMICONDUCTOR INC·Filed 2021·Granted Oct 3, 2023·0 cites·11 claims
- 0775US11774372B2Smart coordinate conversion and calibration system in semiconductor wafer manufacturingELITE SEMICONDUCTOR INC·Filed 2021·Granted Oct 3, 2023·0 cites·13 claims
- 0875US11761904B2Smart defect calibration system in semiconductor wafer manufacturingELITE SEMICONDUCTOR INC·Filed 2021·Granted Sep 19, 2023·0 cites·11 claims
- 0975US11719649B2Method for smart conversion and calibration of coordinateELITE SEMICONDUCTOR INC·Filed 2021·Granted Aug 8, 2023·0 cites·8 claims
- 1075US11719650B2Method for performing smart semiconductor wafer defect calibrationELITE SEMICONDUCTOR INC·Filed 2021·Granted Aug 8, 2023·0 cites·10 claims
- 1175US11719648B2Method for smart conversion and calibration of coordinateELITE SEMICONDUCTOR INC·Filed 2021·Granted Aug 8, 2023·0 cites·6 claims
- 1274US10228421B2Method and system for intelligent defect classification and sampling, and non-transitory computer-readable storage deviceELITE SEMICONDUCTOR INC·Filed 2016·Granted Mar 12, 2019·2 cites·12 claims
- 1361US10726192B2Semiconductor Fab's defect operating system and method thereofELITE SEMICONDUCTOR INC·Filed 2019·Granted Jul 28, 2020·1 cites·16 claims
- 1458US8473223B2Method for utilizing fabrication defect of an articleLEU IYUN·Filed 2009·Granted Jun 25, 2013·2 cites·18 claims
- 1556US10312164B2Method and system for intelligent weak pattern diagnosis, and non-transitory computer-readable storage mediumELITETECH TECH CO LTD·Filed 2014·Granted Jun 4, 2019·1 cites·19 claims
- 1650US8095895B2Method for defect diagnosis and managementLEU IYUN·Filed 2009·Granted Jan 10, 2012·1 cites·13 claims
- 1748US2010332206A1Method for simulating leakage distribution of integrated circuit designLEU IYUN·Filed 2009·Application pending·0 cites
- 1842US10409924B2Intelligent CAA failure pre-diagnosis method and system for design layoutELITE SEMICONDUCTOR INC·Filed 2017·Granted Sep 10, 2019·0 cites·13 claims
- 1941US10719655B2Method and system for quickly diagnosing, classifying, and sampling in-line defects based on CAA pre-diagnosis databaseELITE SEMICONDUCTOR INC·Filed 2018·Granted Jul 21, 2020·0 cites·8 claims
- 2034US8863056B2Integrated design-for-manufacturing platformLEU IYUN KEVIN·Filed 2007·Granted Oct 14, 2014·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →