Inventor · disambiguated record
Izuo Horai
Also filed as: HORAI IZUO
7 granted patents·2 pending applications·208 citations·filing 1991–2012
88Inventor score
Files withHITACHI ELECTR ENG4HITACHI HIGH TECH CORP2HIROSE NOBUAKI1HITACHI HIGH TECH ELECT ENG CO1HORAI IZUO1
Top patents by PatentIndex Score
9 records- 0194US7777876B2Inspection method and inspection deviceHITACHI HIGH TECH CORP·Filed 2008·Granted Aug 17, 2010·27 cites·19 claims
- 0289US9007581B2Inspection method and inspection deviceHORAI IZUO·Filed 2012·Granted Apr 14, 2015·13 cites·26 claims
- 0385US5245403AApparatus for detecting extraneous substances on a glass plateHITACHI ELECTR ENG·Filed 1991·Granted Sep 14, 1993·71 cites·12 claims
- 0471US6888918B2Surface inspection method and surface inspection apparatusHITACHI HIGH TECH ELECT ENG CO·Filed 2003·Granted May 3, 2005·11 cites·20 claims
- 0571US5898491ASurface defect test method and surface defect testerHITACHI ELECTR ENG·Filed 1998·Granted Apr 27, 1999·41 cites·15 claims
- 0665US6057926AMagnetic disk testing method and surface defect testing deviceHITACHI ELECTR ENG·Filed 1998·Granted May 2, 2000·29 cites·17 claims
- 0762US5875027ASensitivity calibration disk for surface defect testerHITACHI ELECTR ENG·Filed 1998·Granted Feb 23, 1999·16 cites·12 claims
- 0852US2010271626A1Inspection method and inspection deviceHITACHI HIGH TECH CORP·Filed 2010·Application pending·0 cites
- 0930US2012176493A1Inspection apparatus and inspection methodHIROSE NOBUAKI·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →