Inventor · disambiguated record
Jason Abt
Also filed as: ABT JASON
16 granted patents·2 pending applications·233 citations·filing 2001–2020
93Inventor score
Top patents by PatentIndex Score
18 records- 0195US7580557B2Method of design analysis of existing integrated circuitsSEMICONDUCTOR INSIGHTS INC·Filed 2008·Granted Aug 25, 2009·44 cites·2 claims
- 0293US7643665B2Method of design analysis of existing integrated circuitsSEMICONDUCTOR INSIGHTS INC·Filed 2004·Granted Jan 5, 2010·49 cites·12 claims
- 0389US11214874B2Method and system for ion beam delayering of a sample and control thereofTECHINSIGHTS INC·Filed 2020·Granted Jan 4, 2022·2 cites·9 claims
- 0485US7693348B2Method of registering and aligning multiple imagesSEMICONDUCTOR INSIGHTS INC·Filed 2005·Granted Apr 6, 2010·26 cites·41 claims
- 0582US7013028B2Advanced schematic editorSEMICONDUCTOR INSIGHTS INC·Filed 2001·Granted Mar 14, 2006·38 cites·17 claims
- 0681US9534299B2Method and system for ion beam delayering of a sample and control thereofSEMICONDUCTOR INSIGHTS INC·Filed 2012·Granted Jan 3, 2017·4 cites·9 claims
- 0776US6907583B2Computer aided method of circuit extractionSEMICONDUCTOR INSIGHTS INC·Filed 2002·Granted Jun 14, 2005·24 cites·21 claims
- 0876US6738957B2Schematic organization toolSEMICONDUCTOR INSIGHTS INC·Filed 2001·Granted May 18, 2004·27 cites·11 claims
- 0975US7765517B2Method and apparatus for removing dummy features from a data structureSEMICONDUCTOR INSIGHTS INC·Filed 2007·Granted Jul 27, 2010·6 cites·11 claims
- 1061US7751643B2Method and apparatus for removing uneven brightness in an imageSEMICONDUCTOR INSIGHTS INC·Filed 2004·Granted Jul 6, 2010·9 cites·22 claims
- 1157US8219940B2Method and apparatus for removing dummy features from a data structureOUALI MOHAMMED·Filed 2005·Granted Jul 10, 2012·2 cites·32 claims
- 1255US10689763B2Method and system for ion beam delayering of a sample and control thereofTECHINSIGHTS INC·Filed 2016·Granted Jun 23, 2020·0 cites·11 claims
- 1355US10550480B2Method and system for ion beam delayering of a sample and control thereofTECHINSIGHTS INC·Filed 2016·Granted Feb 4, 2020·0 cites·12 claims
- 1450US7873203B2Method of design analysis of existing integrated circuitsSEMICONDUCTOR INSIGHTS INC·Filed 2008·Granted Jan 18, 2011·0 cites·10 claims
- 1549US7207018B2Method and apparatus for locating short circuit faults in an integrated circuit layoutSEMICONDUCTOR INSIGHTS INC·Filed 2004·Granted Apr 17, 2007·2 cites·16 claims
- 1648US7886258B2Method and apparatus for removing dummy features from a data structureSEMICONDUCTOR INSIGHTS INC·Filed 2010·Granted Feb 8, 2011·0 cites·6 claims
- 1743US2008123996A1Method of registering and aligning multiple imagesSEMICONDUCTOR INSIGHTS INC·Filed 2007·Application pending·0 cites
- 1836US2007256037A1Net-list organization toolsZAVADSKY VYACHESLAV L·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →