Inventor · disambiguated record
Jan Wouter Bijlsma
Also filed as: BIJLSMA JAN WOUTER
3 granted patents·1 pending application·3 citations·filing 2015–2022
55Inventor score
Files withASML NETHERLANDS BV4
Top patents by PatentIndex Score
4 records- 0174US10296681B2Process based metrology target designASML NETHERLANDS BV·Filed 2018·Granted May 21, 2019·1 cites·23 claims
- 0273US10007744B2Process based metrology target designASML NETHERLANDS BV·Filed 2015·Granted Jun 26, 2018·2 cites·20 claims
- 0352US11875101B2Method for patterning process modellingASML NETHERLANDS BV·Filed 2020·Granted Jan 16, 2024·0 cites·20 claims
- 0450US2025013158A1Surrounding pattern and process aware metrologyASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →