Inventor · disambiguated record
Jasper S. Gibbons
Also filed as: GIBBONS JASPER · GIBBONS JASPER S
10 granted patents·3 pending applications·33 citations·filing 2006–2025
86Inventor score
Top patents by PatentIndex Score
13 records- 0195US11538508B2Memory module multiple port buffer techniquesMICRON TECHNOLOGY INC·Filed 2020·Granted Dec 27, 2022·5 cites·20 claims
- 0283US8692320B2Recessed memory cell access devices and gate electrodesGIBBONS JASPER S·Filed 2011·Granted Apr 8, 2014·9 cites·19 claims
- 0380US9742952B2Image scanning and object storageSCANNER BIN LLC·Filed 2015·Granted Aug 22, 2017·5 cites·8 claims
- 0475US7608495B1Transistor forming methodsMICRON TECHNOLOGY INC·Filed 2008·Granted Oct 27, 2009·6 cites·27 claims
- 0573US2025329356A1Memory module multiple port buffer techniquesMICRON TECHNOLOGY INC·Filed 2025·Application pending·0 cites
- 0671US12300349B2Memory module multiple port buffer techniquesMICRON TECHNOLOGY INC·Filed 2022·Granted May 13, 2025·0 cites·20 claims
- 0769US7888255B2Method of forming an antifuse and a conductive interconnect, and methods of forming DRAM circuitryMICRON TECHNOLOGY INC·Filed 2010·Granted Feb 15, 2011·3 cites·21 claims
- 0864US7713857B2Methods of forming an antifuse and a conductive interconnect, and methods of forming DRAM circuitryMICRON TECHNOLOGY INC·Filed 2008·Granted May 11, 2010·3 cites·26 claims
- 0955US8860174B2Recessed antifuse structures and methods of making the sameSMITH CASEY·Filed 2006·Granted Oct 14, 2014·2 cites·20 claims
- 1052US9502516B2Recessed access devices and gate electrodesMICRON TECHNOLOGY INC·Filed 2014·Granted Nov 22, 2016·0 cites·12 claims
- 1150US8039327B2Transistor forming methodsMICRON TECHNOLOGY INC·Filed 2009·Granted Oct 18, 2011·0 cites·20 claims
- 1250US2015014811A1Antifuses and methods of forming antifuses and antifuse structuresMICRON TECHNOLOGY INC·Filed 2014·Application pending·0 cites
- 1340US2007262395A1Memory cell access devices and methods of making the sameGIBBONS JASPER S·Filed 2006·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →