Inventor · disambiguated record
James Hoffman
Also filed as: HOFFMAN JAMES · HOFFMAN JAMES J · HOFFMAN JAMES JOSEPH
14 granted patents·4 pending applications·448 citations·filing 2002–2017
92Inventor score
Top patents by PatentIndex Score
18 records- 0196US8174400B2Frequency monitoring to detect plasma process abnormalityPARK BEOM SOO·Filed 2011·Granted May 8, 2012·324 cites·15 claims
- 0293US10043693B1Method and apparatus for handling substrates in a processing system having a buffer chamberAPPLIED MATERIALS INC·Filed 2017·Granted Aug 7, 2018·20 cites·20 claims
- 0392US7902991B2Frequency monitoring to detect plasma process abnormalityAPPLIED MATERIALS INC·Filed 2007·Granted Mar 8, 2011·24 cites·28 claims
- 0486US7477956B2Methods and apparatus for enhancing electronic device manufacturing throughputAPPLIED MATERIALS INC·Filed 2005·Granted Jan 13, 2009·22 cites·25 claims
- 0583US7784183B2System and method for adjusting performance of manufacturing operations or stepsGEN ELECTRIC·Filed 2005·Granted Aug 31, 2010·12 cites·4 claims
- 0679US8643849B2Measurement systems and methodsTAO LI·Filed 2011·Granted Feb 4, 2014·11 cites·18 claims
- 0778US7474934B2Methods and apparatus for enhancing electronic device manufacturing throughputAPPLIED MATERIALS INC·Filed 2005·Granted Jan 6, 2009·7 cites·27 claims
- 0876US10460922B2Method and apparatus for substrate transfer in a thermal treatment chamberAPPLIED MATERIALS INC·Filed 2017·Granted Oct 29, 2019·2 cites·20 claims
- 0974US7440091B2Sensors for dynamically detecting substrate breakage and misalignment of a moving substrateAPPLIED MATERIALS INC·Filed 2004·Granted Oct 21, 2008·16 cites·20 claims
- 1073US9008833B2Dynamic routing control methods and systems for a cluster toolHOFFMAN JAMES·Filed 2012·Granted Apr 14, 2015·3 cites·20 claims
- 1171US6716080B2Anodically bonded elements for flat-panel displaysMICRON TECHNOLOGY INC·Filed 2002·Granted Apr 6, 2004·5 cites·43 claims
- 1266US7834994B2Sensors for dynamically detecting substrate breakage and misalignment of a moving substrateAPPLIED MATERIALS INC·Filed 2008·Granted Nov 16, 2010·2 cites·29 claims
- 1345US2010251546A1System and method for adjusting performance of manaufacturing operations or stepsROCKSTROH TODD JAY·Filed 2010·Application pending·0 cites
- 1442US8670857B2Flexible process condition monitoringKIM HONG SOON·Filed 2011·Granted Mar 11, 2014·0 cites·13 claims
- 1538US8674844B2Detecting plasma chamber malfunctionPARK BEOM SOO·Filed 2010·Granted Mar 18, 2014·0 cites·15 claims
- 1637US2007198123A1System and method for measuring machining tools and using data generated therefromHOFFMAN JAMES J·Filed 2006·Application pending·0 cites
- 1736US2012149281A1Distance measurement systems and methodsWAN XINJUN·Filed 2011·Application pending·0 cites
- 1833US2016054731A1Systems, apparatus, and methods for processing recipe protection and securityAPPLIED MATERIALS INC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →