Inventor · disambiguated record
Jacob Pieter Hoogenboom
Also filed as: HOOGENBOOM JACOB PIETER
7 granted patents·15 citations·filing 2011–2020
78Inventor score
Top patents by PatentIndex Score
7 records- 0181US10651009B2Method for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscopeDELMIC B V·Filed 2015·Granted May 12, 2020·4 cites·34 claims
- 0274US9378921B2Integrated optical and charged particle inspection apparatusDELMIC B V·Filed 2013·Granted Jun 28, 2016·4 cites·18 claims
- 0374US8895921B2Inspection apparatus and replaceable door for a vacuum chamber of such an inspection apparatus and a method for operating an inspection apparatusKRUIT PIETER·Filed 2011·Granted Nov 25, 2014·3 cites·17 claims
- 0472US11742173B2Integrated optical and charged particle inspection apparatusDELMIC IP B V·Filed 2020·Granted Aug 29, 2023·1 cites·20 claims
- 0570US9715992B2Integrated optical and charged particle inspection apparatusDELMIC B V·Filed 2013·Granted Jul 25, 2017·3 cites·17 claims
- 0646USRE50540EMethod for inspecting a sample using an assembly comprising a scanning electron microscope and a light microscopeDELMIC IP B V·Filed 2015·Granted Aug 19, 2025·0 cites·37 claims
- 0744US10132753B2Method and apparatus for determining a density of fluorescent markers in a sampleDELMIC B V·Filed 2015·Granted Nov 20, 2018·0 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →