Inventor · disambiguated record
Jan Klusá{Hacek Over (C)}Ek
Also filed as: KLUSÁ{HACEK OVER (C)}EK JAN
6 granted patents·4 citations·filing 2020–2021
69Inventor score
Files withFEI CO6
Top patents by PatentIndex Score
6 records- 0180US11815479B2Method of examining a sample using a charged particle beam apparatusFEI CO·Filed 2021·Granted Nov 14, 2023·1 cites·13 claims
- 0278US11519871B2Method of examining a sample using a charged particle microscopeFEI CO·Filed 2020·Granted Dec 6, 2022·2 cites·18 claims
- 0374US11327032B2Method of examining a sample using a charged particle microscopeFEI CO·Filed 2020·Granted May 10, 2022·1 cites·18 claims
- 0453US11703468B2Method and system for determining sample composition from spectral dataFEI CO·Filed 2021·Granted Jul 18, 2023·0 cites·24 claims
- 0546US11971372B2Method of examining a sample using a charged particle microscopeFEI CO·Filed 2020·Granted Apr 30, 2024·0 cites·11 claims
- 0644US11598733B2Method of examining a sample using a charged particle microscopeFEI CO·Filed 2020·Granted Mar 7, 2023·0 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →