Inventor · disambiguated record
James H. Stathis
Also filed as: STATHIS JAMES · STATHIS JAMES H
20 granted patents·2 pending applications·32 citations·filing 1999–2024
91Inventor score
Files withIBM15STATHIS JAMES H2Shark Toolers2GLOBALFOUNDRIES INC1SHARK TOOLERS A DBA OF STATHIS & LIEBESFELD LLC1
Top patents by PatentIndex Score
22 records- 0191US10746782B2Accelerated wafer testing using non-destructive and localized stressIBM·Filed 2017·Granted Aug 18, 2020·4 cites·16 claims
- 0284US10739397B2Accelerated wafer testing using non-destructive and localized stressIBM·Filed 2017·Granted Aug 11, 2020·2 cites·20 claims
- 0384US10125533B1Small frangible shimShark Toolers·Filed 2017·Granted Nov 13, 2018·9 cites·12 claims
- 0481US10796833B2Magnetic tunnel junction with low series resistanceIBM·Filed 2018·Granted Oct 6, 2020·2 cites·18 claims
- 0580US9287185B1Determining appropriateness of sampling integrated circuit test data in the presence of manufacturing variationsIBM·Filed 2015·Granted Mar 15, 2016·3 cites·20 claims
- 0680US8839180B1Dielectric reliability assessment for advanced semiconductorsIBM·Filed 2013·Granted Sep 16, 2014·4 cites·15 claims
- 0777US9026981B2Dielectric reliability assessment for advanced semiconductorsIBM·Filed 2014·Granted May 5, 2015·3 cites·9 claims
- 0876US10102090B2Non-destructive analysis to determine use history of processorIBM·Filed 2016·Granted Oct 16, 2018·2 cites·20 claims
- 0964US11869783B2Optimizating semiconductor binning by feed-forward process adjustmentIBM·Filed 2021·Granted Jan 9, 2024·0 cites·25 claims
- 1058US10552278B2Non-destructive analysis to determine use history of processorIBM·Filed 2018·Granted Feb 4, 2020·0 cites·20 claims
- 1153US12449050B2Pipe burst prevention ceramic cartridge, valve system and methodSTATHIS JAMES H·Filed 2024·Granted Oct 21, 2025·0 cites·20 claims
- 1253US11049744B2Optimizing semiconductor binning by feed-forward process adjustmentIBM·Filed 2017·Granted Jun 29, 2021·0 cites·13 claims
- 1352US11105856B2Detection of performance degradation in integrated circuitsIBM·Filed 2018·Granted Aug 31, 2021·0 cites·20 claims
- 1451US10574240B2Ring oscillator structures to determine local voltage valueIBM·Filed 2017·Granted Feb 25, 2020·0 cites·18 claims
- 1549US10830841B1Magnetic tunnel junction performance monitoring based on magnetic field couplingIBM·Filed 2019·Granted Nov 10, 2020·0 cites·20 claims
- 1649US2025283554A1Pipe Burst Prevention Cartridge with Washer, Valve System and MethodSTATHIS JAMES H·Filed 2024·Application pending·0 cites
- 1747US11391051B2Contour spackle knifeShark Toolers·Filed 2020·Granted Jul 19, 2022·0 cites·7 claims
- 1844US2021238868A1Corner bead square and spackle applicatorSHARK TOOLERS A DBA OF STATHIS & LIEBESFELD LLC·Filed 2020·Application pending·0 cites
- 1941US10103060B2Test structures for dielectric reliability evaluationsGLOBALFOUNDRIES INC·Filed 2015·Granted Oct 16, 2018·0 cites·20 claims
- 2037US6602772B2Method for non-contact stress evaluation of wafer gate dielectric reliabilityIBM·Filed 2001·Granted Aug 5, 2003·0 cites·11 claims
- 2133US6326732B1Apparatus and method for non-contact stress evaluation of wafer gate dielectric reliabilityIBM·Filed 1999·Granted Dec 4, 2001·3 cites·17 claims
- 2212USD773275SUniversal tool handleSTATHIS JAMES·Filed 2014·Granted Dec 6, 2016·0 cites·1 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →