Inventor · disambiguated record
Jan Stopka
Also filed as: STOPKA JAN
4 granted patents·3 pending applications·0 citations·filing 2021–2024
53Inventor score
Files withFEI CO7
Top patents by PatentIndex Score
7 records- 0161US12106933B2Method to correct first order astigmatism and first order distortion in multi-beam scanning electron microscopesFEI CO·Filed 2022·Granted Oct 1, 2024·0 cites·14 claims
- 0256US12057287B2Methods and systems for aligning a multi-beam systemFEI CO·Filed 2022·Granted Aug 6, 2024·0 cites·20 claims
- 0354US2025349498A1Split-column acceleration tube for scanning electron microscopeFEI CO·Filed 2024·Application pending·0 cites
- 0452US2025357071A1Scanning deflectorFEI CO·Filed 2024·Application pending·0 cites
- 0551US11676795B2Charged particle beam device for inspection of a specimen with a plurality of charged particle beamletsFEI CO·Filed 2021·Granted Jun 13, 2023·0 cites·18 claims
- 0649US12380596B2Method and system for determining beam positionFEI CO·Filed 2021·Granted Aug 5, 2025·0 cites·18 claims
- 0745US2025006453A1Magnetic lenses, charged particle microscope systems including the same, and associated methodsFEI CO·Filed 2023·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →