Inventor · disambiguated record
Jaione Tirapu-Azpiroz
Also filed as: TIRAPU AZPIROZ JAIONE
4 granted patents·1 pending application·41 citations·filing 2008–2013
75Inventor score
Top patents by PatentIndex Score
5 records- 0194US8458626B1Method for calibrating an SRAF printing modelTIRAPU-AZPIROZ JAIONE·Filed 2012·Granted Jun 4, 2013·20 cites·20 claims
- 0291US8271910B2EMF correction model calibration using asymmetry factor data obtained from aerial images or a patterned layerTIRAPU-AZPIROZ JAIONE·Filed 2010·Granted Sep 18, 2012·9 cites·13 claims
- 0383US8108802B2Method for forming arbitrary lithographic wavefronts using standard mask technologyROSENBLUTH ALAN E·Filed 2009·Granted Jan 31, 2012·10 cites·18 claims
- 0468US8059885B2Calculating image intensity of mask by decomposing Manhattan polygon based on parallel edgeTIRAPU-AZPIROZ JAIONE·Filed 2008·Granted Nov 15, 2011·2 cites·25 claims
- 0542US2014297223A1Method for using optical metrology to monitor critical dimension uniformityIBM·Filed 2013·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →