Inventor · disambiguated record
James Alan Turnquist
Also filed as: TURNQUIST JAMES ALAN
12 granted patents·2 pending applications·468 citations·filing 1997–2003
94Inventor score
Files withADVANTEST CORP13
Top patents by PatentIndex Score
14 records- 0190US6377065B1Glitch detection for semiconductor test systemADVANTEST CORP·Filed 2000·Granted Apr 23, 2002·50 cites·12 claims
- 0289US6567941B1Event based test system storing pin calibration data in non-volatile memoryADVANTEST CORP·Filed 2000·Granted May 20, 2003·43 cites·7 claims
- 0388US6557128B1Semiconductor test system supporting multiple virtual logic testersADVANTEST CORP·Filed 1999·Granted Apr 29, 2003·71 cites·16 claims
- 0486US6532561B1Event based semiconductor test systemADVANTEST CORP·Filed 1999·Granted Mar 11, 2003·62 cites·12 claims
- 0585US5883906APattern data compression and decompression for semiconductor test systemADVANTEST CORP·Filed 1997·Granted Mar 16, 1999·64 cites·15 claims
- 0679US6678643B1Event based semiconductor test systemADVANTEST CORP·Filed 1999·Granted Jan 13, 2004·55 cites·8 claims
- 0779US6404218B1Multiple end of test signal for event based test systemADVANTEST CORP·Filed 2000·Granted Jun 11, 2002·24 cites·14 claims
- 0875US6578169B1Data failure memory compaction for semiconductor test systemADVANTEST CORP·Filed 2000·Granted Jun 10, 2003·19 cites·9 claims
- 0972US7089135B2Event based IC test systemADVANTEST CORP·Filed 2002·Granted Aug 8, 2006·15 cites·17 claims
- 1065US6360343B1Delta time event based test systemADVANTEST CORP·Filed 1999·Granted Mar 19, 2002·27 cites·8 claims
- 1165US6226765B1Event based test system data memory compressionADVANTEST CORP·Filed 1999·Granted May 1, 2001·27 cites·8 claims
- 1260US6668331B1Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memoryADVANTEST CORP·Filed 2000·Granted Dec 23, 2003·11 cites·8 claims
- 1334US2003110427A1Semiconductor test system storing pin calibration data in non-volatile memoryADVANTEST CORP·Filed 2003·Application pending·0 cites
- 1433US2002157053A1Semiconductor test system with time critical sequence generation using general purpose operating systemFiled 2001·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →