Inventor · disambiguated record
James E. Willis
Also filed as: WILLIS JAMES · WILLIS JAMES E · WILLIS JAMES EDMUND
10 granted patents·6 pending applications·364 citations·filing 1990–2006
91Inventor score
Top patents by PatentIndex Score
16 records- 0196US7477960B2Fault detection and classification (FDC) using a run-to-run controllerTOKYO ELECTRON LTD·Filed 2005·Granted Jan 13, 2009·86 cites·51 claims
- 0294US7300730B1Creating an optically tunable anti-reflective coatingTOKYO ELECTRON LTD·Filed 2006·Granted Nov 27, 2007·26 cites·28 claims
- 0385US5663997AGlass composition determination method and apparatusASOMA INSTR INC·Filed 1995·Granted Sep 2, 1997·89 cites·16 claims
- 0483US7213478B2Method for automatic configuration of processing systemTOKYO ELECTRON LTD·Filed 2004·Granted May 8, 2007·41 cites·36 claims
- 0581US7763404B2Methods and apparatus for changing the optical properties of resistsTOKYO ELECTRON LTD·Filed 2006·Granted Jul 27, 2010·7 cites·42 claims
- 0679US5743838AExercise systemFiled 1996·Granted Apr 28, 1998·68 cites·25 claims
- 0777US7555395B2Methods and apparatus for using an optically tunable soft mask to create a profile libraryTOKYO ELECTRON LTD·Filed 2006·Granted Jun 30, 2009·5 cites·38 claims
- 0861US5047001AMethod for constructing a reversible duffle bagWILLIS JAMES E·Filed 1990·Granted Sep 10, 1991·32 cites·7 claims
- 0955US7437199B2Method for data pre-populationTOKYO ELECTRON LTD·Filed 2004·Granted Oct 14, 2008·6 cites·33 claims
- 1045US2008074678A1Accuracy of optical metrology measurementsTOKYO ELECTRON LTD·Filed 2006·Application pending·0 cites
- 1145US2008074677A1accuracy of optical metrology measurementsTOKYO ELECTRON LTD·Filed 2006·Application pending·0 cites
- 1245US2008076046A1accuracy of optical metrology measurementsTOKYO ELECTRON LTD·Filed 2006·Application pending·0 cites
- 1342US2008077352A1Methods and apparatus for using an optically tunable soft mask profile libraryTOKYO ELECTRON LTD·Filed 2006·Application pending·0 cites
- 1440US2006079983A1R2R controller to automate the data collection during a DOETOKYO ELECTRON LTD·Filed 2004·Application pending·0 cites
- 1535USD386789SEducational toyWILLIS JAMES EDMUND·Filed 1996·Granted Nov 25, 1997·4 cites·1 claims
- 1635US2004004708A1Method and system for data handling, storage and manipulationTOKYO ELECTRON LTD·Filed 2003·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →