Inventor · disambiguated record
Jared P. Yanofsky
Also filed as: YANOFSKY JARED P
4 granted patents·10 citations·filing 2013–2014
61Inventor score
Top patents by PatentIndex Score
4 records- 0185US8987010B1Microprocessor image correction and method for the detection of potential defectsIBM·Filed 2013·Granted Mar 24, 2015·10 cites·16 claims
- 0244US9412691B2Chip carrier with dual-sided chip access and a method for testing a chip using the chip carrierGLOBALFOUNDRIES INC·Filed 2014·Granted Aug 9, 2016·0 cites·19 claims
- 0338US9638581B2Determining thermal profiles of semiconductor structuresGLOBALFOUNDRIES INC·Filed 2014·Granted May 2, 2017·0 cites·5 claims
- 0437US9209082B2Methods of localized hardening of dicing channel by applying localized heat in wafer kerfIBM·Filed 2014·Granted Dec 8, 2015·0 cites·19 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →