Inventor · disambiguated record
Jeong-Hee Cho
Also filed as: CHO JEONG HEE
17 granted patents·9 pending applications·93 citations·filing 2002–2018
92Inventor score
Files withSAMSUNG ELECTRONICS CO LTD9PSK INC7SAMSUNG KWANGJU ELECTRONICS CO6CHO JEONG-HEE3LEE BYUNG-JO1
Top patents by PatentIndex Score
26 records- 0190US9254069B2Vacuum cleanerSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Feb 9, 2016·25 cites·15 claims
- 0288US10105022B2Vacuum cleanerSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Oct 23, 2018·14 cites·17 claims
- 0384US11229332B2Vacuum cleanerSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Jan 25, 2022·4 cites·12 claims
- 0483US7937802B2Vacuum cleaner for use in both upright form and canister formSAMSUNG KWANGJU ELECTRONICS CO·Filed 2008·Granted May 10, 2011·14 cites·8 claims
- 0582US10799080B2CleanerSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Oct 13, 2020·5 cites·9 claims
- 0677US7483156B2Method for measuring overlay and overlay mark used thereforSAMSUNG ELECTRONICS CO LTD·Filed 2005·Granted Jan 27, 2009·8 cites·15 claims
- 0774US7653964B2Apparatus for adjusting height of suction brushSAMSUNG KWANGJU ELECTRONICS CO·Filed 2006·Granted Feb 2, 2010·7 cites·8 claims
- 0872US8435318B2Vacuum cleaner having dual locking structureLEE BYUNG-JO·Filed 2010·Granted May 7, 2013·5 cites·7 claims
- 0972US7814614B2Suction brush for vacuum cleanerSAMSUNG KWANGJU ELECTRONICS CO·Filed 2006·Granted Oct 19, 2010·5 cites·9 claims
- 1068US7406743B2Handle unit for vacuum cleanerSAMSUNG KWANGJU ELECTRONICS CO·Filed 2006·Granted Aug 5, 2008·3 cites·18 claims
- 1153US8505157B2Vacuum cleanerCHO JEONG-HEE·Filed 2009·Granted Aug 13, 2013·0 cites·13 claims
- 1253US8402598B2Upright-type vacuum cleanerCHO JEONG-HEE·Filed 2010·Granted Mar 26, 2013·1 cites·11 claims
- 1352US2009031520A1Upright vacuum cleanerSAMSUNG KWANGJU ELECTRONICS CO·Filed 2008·Application pending·0 cites
- 1449US6911287B2Method and apparatus for measuring process errors and method and apparatus for measuring overlay using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2002·Granted Jun 28, 2005·2 cites·23 claims
- 1547US11197594B2CleanerSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Dec 14, 2021·0 cites·14 claims
- 1646US10312060B2Plasma generating apparatus using mutual inductive coupling and substrate treating apparatus comprising the samePSK INC·Filed 2014·Granted Jun 4, 2019·0 cites·14 claims
- 1746US2016013029A1Apparatus For Generating Plasma Using Dual Plasma Source And Apparatus For Treating Substrate Including The SamePSK INC·Filed 2014·Application pending·0 cites
- 1845US2015136734A1Substrate Treating Apparatus and MethodPSK INC·Filed 2014·Application pending·0 cites
- 1944US2008230929A1Overlay mark of semiconductor device and semiconductor device including the overlay markSAMSUNG ELECTRONICS CO LTD·Filed 2008·Application pending·0 cites
- 2044US2016013031A1Substrate Processing Device and Method of Handling Particles ThereofPSK INC·Filed 2014·Application pending·0 cites
- 2144US2016020073A1Plasma generation device, method of controlling characteristic of plasma, and substrate processing device using samePSK INC·Filed 2014·Application pending·0 cites
- 2244US2007175185A1Dust separating apparatusSAMSUNG KWANGJU ELECTRONICS CO·Filed 2006·Application pending·0 cites
- 2343US9536708B2Plasma generating device, method of controlling the same, and substrate processing device including the plasma generating devicePSK INC·Filed 2014·Granted Jan 3, 2017·0 cites·27 claims
- 2441US7693682B2Method for measuring critical dimensions of a pattern using an overlay measuring apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2007·Granted Apr 6, 2010·0 cites·5 claims
- 2531US2017301514A1Plasma source and substrate treating apparatus including the samePSK INC·Filed 2016·Application pending·0 cites
- 2629US2012234363A1Photomask cleaning apparatusCHO JEONG-HEE·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →