Inventor · disambiguated record
Jeffrey D. Currin
Also filed as: CURRIN JEFFREY D · CURRIN JEFFREY DIAL · SKALA LEGAL REPRESENTATIVE VICKI L
9 granted patents·1 pending application·498 citations·filing 1995–2025
91Inventor score
Top patents by PatentIndex Score
10 records- 0194US5883523ACoherent switching power for an analog circuit testerCREDENCE SYSTEMS CORP·Filed 1997·Granted Mar 16, 1999·136 cites·13 claims
- 0293US5684421ACompensated delay locked loop timing vernierCREDENCE SYSTEMS CORP·Filed 1995·Granted Nov 4, 1997·165 cites·17 claims
- 0383US6087843AIntegrated circuit tester with test head including regulating capacitorCREDENCE SYSTEMS CORP·Filed 1997·Granted Jul 11, 2000·60 cites·1 claims
- 0480US6104223ACalibratable programmable phase shifterCREDENCE SYSTEMS CORP·Filed 1998·Granted Aug 15, 2000·53 cites·4 claims
- 0579US6330197B1System for linearizing a programmable delay circuitCREDENCE SYSTEMS CORP·Filed 2000·Granted Dec 11, 2001·37 cites·21 claims
- 0663US2025306107A1Stacked parametric measurement unit test circuitELEVATE SEMICONDUCTOR INC·Filed 2025·Application pending·0 cites
- 0758US5999008AIntegrated circuit tester with compensation for leakage currentCREDENCE SYSTEMS CORP·Filed 1997·Granted Dec 7, 1999·19 cites·6 claims
- 0857US5789958AApparatus for controlling timing of signal pulsesCREDENCE SYSTEMS CORP·Filed 1997·Granted Aug 4, 1998·22 cites·12 claims
- 0936US6194911B1Integrated circuit tester with compensation for leakage currentCREDENCE SYSTEMS CORP·Filed 1999·Granted Feb 27, 2001·6 cites·19 claims
- 1030US8295182B2Routed event test system and methodJULA JAMES·Filed 2008·Granted Oct 23, 2012·0 cites·20 claims
Join the waitlist — get patent alerts
Get an alert when Jeffrey D. Currin files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →