Inventor · disambiguated record
Jean-Claude Fournel
Also filed as: FOURNEL JEAN-CLAUDE
6 granted patents·73 citations·filing 1995–2004
82Inventor score
Technology areasG01R
Top patents by PatentIndex Score
6 records- 0163US5996099AMethod and apparatus for automatically testing electronic components in parallel utilizing different timing signals for each electronic componentSCHLUMBERGER IND SA·Filed 1996·Granted Nov 30, 1999·29 cites·8 claims
- 0257US7177777B2Synchronization of multiple test instrumentsCREDENCE SYSTEMS CORP·Filed 2004·Granted Feb 13, 2007·9 cites·17 claims
- 0355US7099792B2Synchronization of multiple test instrumentsCREDENCE SYSTEMS CORP·Filed 2004·Granted Aug 29, 2006·8 cites·18 claims
- 0453US6049900AAutomatic parallel electronic component testing method and equipmentSCHLUMBERGER IND SA·Filed 1996·Granted Apr 11, 2000·21 cites·5 claims
- 0527US5944846AMethod and apparatus for selectively testing identical pins of a plurality of electronic componentsSCHLUMBERGER IND SA·Filed 1996·Granted Aug 31, 1999·3 cites·6 claims
- 0625US6006346AMethod and equipment for automatically testing electronic componentsSCHLUMBERGER IND SA·Filed 1995·Granted Dec 21, 1999·3 cites·11 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →