Inventor · disambiguated record
Jef Goossens
Also filed as: GOOSSENS JEF
1 granted patent·2 pending applications·0 citations·filing 2019–2023
11Inventor score
Files withASML NETHERLANDS BV3
Top patents by PatentIndex Score
3 records- 0151US11764030B2Stage apparatus suitable for electron beam inspection apparatusASML NETHERLANDS BV·Filed 2019·Granted Sep 19, 2023·0 cites·15 claims
- 0251US2025218720A1Method of wafer grounding utilizing wafer edge backside coating exclusion areaASML NETHERLANDS BV·Filed 2023·Application pending·0 cites
- 0349US2025037961A1Beam position displacement correction in charged particle inspectionASML NETHERLANDS BV·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →