Inventor · disambiguated record
Jeffrey A. Jalkio
Also filed as: JALKIO JEFFREY A
9 granted patents·412 citations·filing 1987–1999
92Inventor score
Files withCYBEROPTICS CORP9
Top patents by PatentIndex Score
9 records- 0194US5005978AApparatus and method for the noncontact measurement of drill diameter, runout, and tip positionCYBEROPTICS CORP·Filed 1989·Granted Apr 9, 1991·57 cites·32 claims
- 0287US5897611AHigh precision semiconductor component alignment systemsCYBEROPTICS CORP·Filed 1996·Granted Apr 27, 1999·72 cites·53 claims
- 0384US4872747AUse of prisms to obtain anamorphic magnificationCYBEROPTICS CORP·Filed 1987·Granted Oct 10, 1989·54 cites·14 claims
- 0481US5309223ALaser-based semiconductor lead measurement systemCYBEROPTICS CORP·Filed 1991·Granted May 3, 1994·48 cites·49 claims
- 0579US4891772APoint and line range sensorsCYBEROPTICS CORP·Filed 1987·Granted Jan 2, 1990·45 cites·33 claims
- 0676US6118538AMethod and apparatus for electronic component lead measurement using light based sensors on a component placement machineCYBEROPTICS CORP·Filed 1997·Granted Sep 12, 2000·40 cites·19 claims
- 0774US5331406AMulti-beam laser sensor for semiconductor lead measurementsCYBEROPTICS CORP·Filed 1992·Granted Jul 19, 1994·36 cites·50 claims
- 0871US6538750B1Rotary sensor system with a single detectorCYBEROPTICS CORP·Filed 1999·Granted Mar 25, 2003·33 cites·118 claims
- 0966US6292261B1Rotary sensor system with at least two detectorsCYBEROPTICS CORP·Filed 1999·Granted Sep 18, 2001·27 cites·77 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →