Inventor · disambiguated record
Jeffrey Johnston
Also filed as: JOHNSTON JEFFREY · JOHNSTON JEFFREY M · JOHNSTON JEFFREY MICHAEL
10 granted patents·2 pending applications·350 citations·filing 1995–2018
90Inventor score
Files withIntersil Americas LLC3JOHNSTON JEFFREY M3DECISION INNOVATIONS INC1HARRIS CORP1INTERSIL CORP1
Top patents by PatentIndex Score
12 records- 0190US6826541B1Methods, systems, and computer program products for facilitating user choices among complex alternatives using conjoint analysisDECISION INNOVATIONS INC·Filed 2000·Granted Nov 30, 2004·183 cites·86 claims
- 0282US9960236B2Method of forming body contact layouts for semiconductor structuresIntersil Americas LLC·Filed 2016·Granted May 1, 2018·3 cites·13 claims
- 0382US8171022B2Methods, systems, and computer program products for facilitating user interaction with customer relationship management, auction, and search engine software using conjoint analysisJOHNSTON JEFFREY M·Filed 2005·Granted May 1, 2012·15 cites·15 claims
- 0479US5481129AAnalog-to-digital converterHARRIS CORP·Filed 1995·Granted Jan 2, 1996·41 cites·14 claims
- 0577US5994755AAnalog-to-digital converter and method of fabricationINTERSIL CORP·Filed 1996·Granted Nov 30, 1999·39 cites·14 claims
- 0675US6329260B1Analog-to-digital converter and method of fabricationINTERSIL INC·Filed 1999·Granted Dec 11, 2001·32 cites·16 claims
- 0761US6493615B1Vehicle diagnostic systemFiled 1999·Granted Dec 10, 2002·35 cites·2 claims
- 0859US10665676B2Body contact layouts for semiconductor structuresIntersil Americas LLC·Filed 2018·Granted May 26, 2020·0 cites·16 claims
- 0951US9536952B2Body contact layouts for semiconductor structuresIntersil Americas LLC·Filed 2015·Granted Jan 3, 2017·0 cites·7 claims
- 1048US2006041401A1Methods, systems, and computer program products for facilitating user choices among complex alternatives using conjoint analysis in combination with psychological tests, skills tests, and configuration softwareJOHNSTON JEFFREY M·Filed 2005·Application pending·0 cites
- 1134US2003006413A1Semiconductor test system and associated methods for wafer level acceptance testingUNIV FLORIDA·Filed 2002·Application pending·0 cites
- 1233USD411119SMasonry guideJOHNSTON JEFFREY M·Filed 1998·Granted Jun 22, 1999·2 cites·1 claims
Join the waitlist — get patent alerts
Get an alert when Jeffrey Johnston files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →