Inventor · disambiguated record
Jeong Jin Lee
Also filed as: LEE JEONG JIN
15 granted patents·5 pending applications·133 citations·filing 1995–2024
90Inventor score
Top patents by PatentIndex Score
20 records- 0190US9846359B1Diffraction-based overlay marks and methods of overlay measurementSAMSUNG ELECTRONICS CO LTD·Filed 2016·Granted Dec 19, 2017·12 cites·20 claims
- 0289US7629677B2Semiconductor package with inner leads exposed from an encapsulantSAMSUNG ELECTRONICS CO LTD·Filed 2006·Granted Dec 8, 2009·26 cites·29 claims
- 0386US12451352B2Method for fabricating semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Oct 21, 2025·1 cites·20 claims
- 0477US6690717B1Multi-tone transceiver system using two steps of DMT-CMFBKOREA ELECTRONICS TELECOMM·Filed 2000·Granted Feb 10, 2004·28 cites·7 claims
- 0569US6188723B1Finite impulse response filter for wave-shaping digital quadrature amplitude modulation symbolsKOREA ELECTRONICS TELECOMM·Filed 1998·Granted Feb 13, 2001·22 cites·18 claims
- 0667US2025147409A1Method for manufacturing semiconductor deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0766US6687291B1Time-domain equalizer of cascaded filters for VDSLELECTROINCS AND TELECOMM RES I·Filed 2000·Granted Feb 3, 2004·16 cites·9 claims
- 0861US10016833B2Solder ball mounterSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Jul 10, 2018·1 cites·8 claims
- 0950US2023197742A1Image sensor and method for fabricating the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Application pending·0 cites
- 1049US5732085AFixed length packet switching apparatus using multiplexers and demultiplexersKOREA ELECTRONICS TELECOMM·Filed 1995·Granted Mar 24, 1998·27 cites·3 claims
- 1146US11799458B2Flip flop circuitSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Oct 24, 2023·0 cites·18 claims
- 1246US10324562B2Method for processing user input and electronic device thereofSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Jun 18, 2019·0 cites·13 claims
- 1346US9281250B2Method of detecting an asymmetric portion of an overlay mark and method of measuring an overlay including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2014·Granted Mar 8, 2016·0 cites·20 claims
- 1442US10656747B2Touch input processing method and electronic device for supporting the sameSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted May 19, 2020·0 cites·15 claims
- 1541US11016603B2Electronic device and operation method thereforSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted May 25, 2021·0 cites·21 claims
- 1641US10795464B2Method for operating touch pad and electronic device for supporting sameSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Oct 6, 2020·0 cites·10 claims
- 1741US2015294455A1Methods of testing pattern reliability and semiconductor devicesSAMSUNG ELECTRONICS CO LTD·Filed 2014·Application pending·0 cites
- 1841US2008073772A1Stacked semiconductor package and method of manufacturing the sameSAMSUNG ELECTRONICS CO LTD·Filed 2006·Application pending·0 cites
- 1937US10119811B2Alignment mark, method of measuring wafer alignment, and method of manufacturing a semiconductor device using the method of measuring wafer alignmentSAMSUNG ELECTRONICS CO LTD·Filed 2017·Granted Nov 6, 2018·0 cites·6 claims
- 2036US2016239148A1Method of controlling activation area of touch screen panel and electronic device using the sameSAMSUNG ELECTRONICS CO LTD·Filed 2016·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →